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CY7C1041DV33-10BVJXI Datasheet(PDF) 6 Page - Cypress Semiconductor

Part # CY7C1041DV33-10BVJXI
Description  CY7C1041DV33 4-Mbit (256 K x 16) Static RAM
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C1041DV33-10BVJXI Datasheet(HTML) 6 Page - Cypress Semiconductor

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CY7C1041DV33
Document Number: 38-05473 Rev. *K
Page 6 of 18
AC Switching Characteristics
Over the Operating Range[6]
Parameter
Description
–10
(Industrial)
Unit
Min
Max
Read Cycle
tpower[7]
VCC(Typical) to the first access
100
s
tRC
Read cycle time
10
ns
tAA
Address to data valid
10
ns
tOHA
Data hold from address change
3
ns
tACE
CE LOW to data valid
10
ns
tDOE
OE LOW to data valid
5
ns
tLZOE
OE LOW to low Z[8]
0–
ns
tHZOE
OE HIGH to high Z[8, 9]
–5
ns
tLZCE
CE LOW to low Z[8]
3–
ns
tHZCE
CE HIGH to high Z[8, 9]
–5
ns
tPU
CE LOW to power-up
0
ns
tPD
CE HIGH to power-down
10
ns
tDBE
Byte enable to data valid
5
ns
tLZBE
Byte enable to low Z
0
ns
tHZBE
Byte disable to high Z
6
ns
Write Cycle[10, 11]
tWC
Write cycle time
10
ns
tSCE
CE LOW to write end
7
ns
tAW
Address setup to write end
7
ns
tHA
Address hold from write end
0
ns
tSA
Address setup to write start
0
ns
tPWE
WE pulse width
7–
ns
tSD
Data setup to write end
5
ns
tHD
Data hold from write end
0
ns
tLZWE
WE HIGH to low Z[8]
3–
ns
tHZWE
WE LOW to high Z[8, 9]
–5
ns
tBW
Byte enable to end of write
7
ns
Notes
6. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the specified IOL/IOH
and 30-pF load capacitance.
7. tPOWER gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access is performed.
8. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, tHZBE is less than tLZBE, and tHZWE is less than tLZWE for any given
device.
9. tHZOE, tHZCE, tHZBE, and tHZWE are specified with a load capacitance of 5 pF as in part (c) of AC Test Loads and Waveforms. Transition is measured when the outputs
enter a high impedance state.
10. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write and the transition of either of
these signals can terminate the write. The input data setup and hold timing should be referenced to the leading edge of the signal that terminates the write.
11. The minimum write cycle time for Write Cycle No. 4 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
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