STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-88565

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43216-5000

REVISION LEVEL

F

SHEET

9

DSCC FORM 2234

APR 97

TABLE IIA. Electrical test requirements.

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(in accordance with

MIL-PRF-38535, table III)

Device

class M

Device

class Q

Device

class V

Interim electrical

parameters (see 4.2)

1

1

1

Final electrical

parameters (see 4.2)

1,2,3,4,5,6 1/

1,2,3,4,5,6 1/

1,2,3,4, 1/ 2/

5,6

Group A test

requirements (see 4.4)

1,2,3,4,5,6,7

1,2,3,4,5,6,7

1,2,3,4,5,6,7

Group C end-point electrical

parameters (see 4.4)

1

1

1 2/

Group D end-point electrical

parameters (see 4.4)

1

1

1

Group E end-point electrical

parameters (see 4.4)

----

----

1, 4

1/ PDA applies to subgroup 1.

2/ See table IIB for delta measurement parameters.

Table IIB. 240 hour burn-in and group C end-point electrical parameters.

Limit

Delta

Parameter

Device type

Min

Max

Min

Max

01

0.4 mV

100

µV

02

0.8 mV

250

µV

01

10 nA

5 nA

02

10 nA

5 nA

01

±25 nA

5 nA

02

±25 nA

5 nA

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device

class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for

device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a.

Tests shall be as specified in table IIA herein.

b.

Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.