LMC6464QML

SNOSAR8A – DECEMBER 2010 – REVISED MARCH 2013

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

16V

Differential Input Voltage

± Supply Voltage

Voltage at Input/Output Pin

− 0.3V

±5 mA

±30 mA

Current at Power Supply Pin

40 mA

150°C

LMC6464

6mW

14LD CDIP (Still Air)

74°C/W

14LD CDIP (500LF/Min Air flow)

37°C/W

14LD CDIP

8°C/W

Storage Temperature Range

Lead Temp. (Soldering, 10 sec.)

260°C

2.0 KV

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the

Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

(2)

Limiting input pin current is only necessary for input voltages that exceed absolute maximum input voltage ratings.

(3)

Applies to both single supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in

exceeding the maximum allowed junction temperature of 150°C. Output currents in excess of ±30 mA over long term may adversely

affect reliability.

(4)

(5)

(6)

All numbers apply for packages soldered directly into a PC board.

(7)

Human body model, 1.5 k

Ω in series with 100 pF.

Recommended Operating Range

(1)

Supply Voltage

3.0V

Operating Temperature Range

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the

Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may

degrade when the device is not operated under the listed test conditions.

2

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