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LMV951MKXNOPB Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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LMV951MKXNOPB Datasheet(HTML) 4 Page - National Semiconductor (TI) |
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4 / 24 page  LMV951 SNOSAI3C – OCTOBER 2006 – REVISED APRIL 2013 www.ti.com 1.8V ELECTRICAL CHARACTERISTICS (1) Unless otherwise specified, all limits specified for at TA = 25°C, V + = 1.8V, V− = 0V, V CM = 0.9V, Shutdown = 0V, and RL = 1 M Ω.Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min Typ Max Units (2) (3) (2) VOS Input Offset Voltage 1.5 2.8 mV 3.0 TC VOS Input Offset Average Drift 0.15 μV/°C IB Input Bias Current 36 80 nA 85 IOS Input Offset Current 0.2 nA CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 1.8V 82 93 dB 80 PSRR Power Supply Rejection Ratio 1V ≤ V+ ≤ 1.8V, VCM = 0.5V 70 92 67 dB 1V ≤ V+ ≤ 3V, VCM = 0.5V 68 85 65 VCM Input Common-Mode Voltage CMRR ≥ 82 dB −0.2 2 V Range CMRR ≥ 80 dB −0.2 2 AV Large Signal Voltage Gain VOUT = 0.2 to 1.6V 86 110 RL = 600Ω to 0.9V 83 dB VOUT = 0.2 to 1.6V 86 116 RL = 2 kΩ to 0.9V 83 VOUT Output Voltage Swing High RL = 600Ω to 0.9V 50 33 60 RL = 2 kΩ to 0.9V 25 13 34 mV from rail Output Voltage Swing Low RL = 600Ω to 0.9V 80 54 105 RL = 2 kΩ to 0.9V 35 17 44 IOUT Output Short Circuit Current (4) Sourcing 50 85 VO = 0V, VIN(DIFF) = ±0.2V 35 mA Sinking 45 80 VO = 1.8V, VIN(DIFF) = ±0.2V 25 IS Supply Current Active Mode VSD <0.5V 570 780 880 μA Shutdown Mode VSD >1.3V 0.3 2.2 10 SR Slew Rate See (5) 1.4 V/ μs GBWP Gain Bandwidth Product 2.8 MHz en Input - Referred Voltage Noise f = 1 kHz 25 nV/ √Hz in Input-Referred Current Noise f = 1 kHz 0.2 pA/Hz THD Total Harmonic Distortion f = 1 kHz, AV = 1, RL = 1 kΩ 0.02 % ISD Shutdown Pin Current Active Mode, VSD = 0V .001 1 µA Shutdown Mode, VSD = 1.8V .001 1 VSD Shutdown Pin Voltage Range Active Mode 0 0.5 V Shutdown Mode 1.45 1.8 (1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions is very limited self- heating of the device. (2) All limits are specified by testing or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) The short circuit test is a momentary test, the short circuit duration is 1.5 ms (5) Number specified is the average of the positive and negative slew rates. 4 Submit Documentation Feedback Copyright © 2006–2013, Texas Instruments Incorporated Product Folder Links: LMV951 |
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