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IRF4410 Datasheet(PDF) 7 Page - Nell Semiconductor Co., Ltd |
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IRF4410 Datasheet(HTML) 7 Page - Nell Semiconductor Co., Ltd |
7 / 9 page SEMICONDUCTOR Nell High Power Products RoHS RoHS IRF4410 Series Fig.20 Typical stored charge vs. di /dt f di /dt (A/μs) f 100 200 300 400 500 600 700 450 400 350 300 250 200 150 100 50 0 • • • P.W. Period di/dt Diode Recovery dv/dt Ripple ≤ 5% Body Diode Forward Drop Re-Applied Voltage Reverse Recovery Current Body Diode Forward Current VGS=10V VDD ISD Driver Gate Drive D.U.T. I SD Waveform D.U.T. VDS Waveform Inductor Curent D = P.W. Period * + - + + + - - - • • • • A Fig.21 Peak diode recovery dv/dt test circuit for N-Channel Circuit Layout Considerations Low Stray lnductance Ground Plane Low Leakage lnductance Current Transformer dv/dt controlled by RG Driver same type as D.U.T. l controlled by Duty Factor D SD " " D.U.T. -Device Under Test D.U.T. RG VDD *V = 5V for Logic Level Devices GS tp lAS + - 15V DRIVER VDD D.U.T. VDS RG 20V tP lAS 0.01Ω L Fig.22a Unclamped lnductive test circuit Fig.22b Unclamped inductive waveforms I = 58A F V = 85V R T =125°C J T =25°C J V(BR)DSS www.nellsemi.com Page 7 of 9 |
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