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CTK24BC02Q8 Datasheet(PDF) 1 Page - Cystech Electonics Corp.

Part # CTK24BC02Q8
Description  2-Wire Serial EEPROMs 1K/2K/4K/8K/16K
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Manufacturer  CYSTEKEC [Cystech Electonics Corp.]
Direct Link  http://www.cystekec.com
Logo CYSTEKEC - Cystech Electonics Corp.

CTK24BC02Q8 Datasheet(HTML) 1 Page - Cystech Electonics Corp.

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CYStech Electronics Corp.
Spec. No. : C705Q8
Issued Date : 2007.08.22
Revised Date :
Page No. : 1/12
CTK24BC01-16Q8
CYStek Product Specification
2-Wire Serial EEPROMs 1K/2K/4K/8K/16K
CTK24BC01-16Q8
Description
The CTK24BC family provides 1K, 2K, 4K, 8K and 16K of serial electrically erasable and programmable
read-only memory (EEPROM). The wide Vdd range allows for low-voltage operation down to 1.8V. The
device, fabricated using traditional CMOS EEPROM technology, is optimized for many industrial and
commercial applications where low-voltage and low-power operation is essential. The device is accessed
via a 2-wire serial interface.
Features
• Internally organized as 128×8(1K), 256×8(2K)
• 100kHz(1.8V)& 400kHz(5V) compatibility
512×8(4K), 1024×8(8K), 2048×8(16K)
• Bi-directional data transfer protocol
• Low-voltage and standard-voltage operation :
• Self-timed write cycle (5ms max)
1.8~5.5V
• Write protect pin for hardware data protection
• 2-wire serial interface bus
• 8-byte page (1K, 2K) and 16-byte page (4K, 8K, 16K)
• Date retention : 100 years
write modes
• High endurance : 1,000,000 write cycles
• Allows for partial page write
Absolute Maximum Ratings
Parameter
Ratings
Unit
Voltage on any pin with respect to ground
-0.8 to VCC+1.5
V
Maximum operating voltage
6.25
V
DC output current
5.0
mA
Operating temperature range
-55 ~ +125
Storage temperature range
-65 ~ +150
Note: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of these specifications are not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.


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