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NCV8667 Datasheet(PDF) 5 Page - ON Semiconductor

Part # NCV8667
Description  150 mA LDO Regulator with Enable, Reset and Early Warning
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCV8667 Datasheet(HTML) 5 Page - ON Semiconductor

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NCV8667
http://onsemi.com
5
ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Min
Max
Unit
Input Voltage DC (Note 1)
Vin
−0.3
40
V
Input Voltage Transient (Note 1)
Vin
45
V
Input Current
Iin
−5
mA
Output Voltage (Note 2)
Vout
−0.3
5.5
V
Output Current
Iout
−3
Current
Limited
mA
Enable Input Voltage DC
VEN
−0.3
40
V
Enable Input Voltage Transient
VEN
45
V
Enable Input Current Range
IEN
−1
1
mA
DT (Reset Delay Time Select) Voltage
VDT
−0.3
5.5
V
DT (Reset Delay Time Select) Current
IDT
−1
1
mA
Reset Output Voltage
VRO
−0.3
5.5
V
Reset Output Current
IRO
−3
3
mA
Sense Input Voltage DC
VSI
−0.3
40
V
Sense Input Voltage Transient
VSI
45
V
Sense Input Current
ISI
−1
1
mA
Sense Output Voltage
VSO
−0.3
5.5
V
Sense Output Current
ISO
−3
3
mA
Maximum Junction Temperature
TJ(max)
−40
150
°C
Storage Temperature
TSTG
−55
150
°C
ESD Capability, Human Body Model (Note 3)
ESDHBM
−2
2
kV
ESD Capability, Machine Model (Note 3)
ESDMM
−200
200
V
Lead Temperature Soldering
Reflow (SMD Styles Only) (Note 4)
TSLD
265 peak
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Refer to ELECTRICAL CHARACTERISTIS and APPLICATION INFORMATION for Safe Operating Area.
2. 5.5 or (Vin + 0.3 V), whichever is lower
3. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per AEC−Q100−002 (EIA/JESD22−A114)
ESD Machine Model tested per AEC−Q100−003 (EIA/JESD22−A115)
4. For information, please refer to our Soldering and Mounting Techniques Reference Manual, SOLDERRM/D


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