BATTERY PROTECTION IC FOR 3-SERIAL- OR 4-SERIAL-CELL PACK

S-8254A Series

Seiko Instruments Inc.

9

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Test Circuits

This chapter describes how to test the S-8254A Series when a 4-serial cell is selected by setting the SEL pin

to the VDD level. When a 3-serial cell is selected by setting the SEL pin to the VSS level, short the power

supply V4.

1. Current Consumption on Operation, Current Consumption at Power-down

(Test circuit 1)

The current at the VSS pin when V1

The current at the VSS pin when V1

2. Overcharge Detection Voltage, Overcharge Release Voltage, Overdischarge Detection Voltage,

Overdischarge Release Voltage, Overcurrent Detection Voltage 1, Overcurrent Detection Voltage

2, Overcurrent Detection Voltage 3, CTL Input Voltage “H”, CTL Input Voltage “L”, SEL Input

Voltage “H”, SEL Input Voltage “L”

(Test circuit 2)

as the initial status).

× 0.9 V or more) after the V1 voltage has been gradually increased starting at the initial status.

the V1 voltage has been gradually decreased.

after the V1 voltage has been gradually decreased starting at the initial status. The overdischarge

has been gradually increased.

When the voltage of Vn (n

= 1.

is “H” after the VINI pin voltage has been gradually increased starting at the initial status.

VINI pin has been gradually decreased.

when the voltage of the DOP pin is “H” after the VMP voltage has been gradually decreased starting at

the initial status.