BUF08832

SBOS476C

– AUGUST 2009 – REVISED JULY 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

PACKAGE

PACKAGE DESIGNATOR

PACKAGE MARKING

BUF08832

HTSSOP-20

PWP

BUF08832

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

PARAMETER

BUF08832

UNIT

Supply Voltage

+22

V

Supply Voltage

+6

V

Digital Input Pins, SCL, SDA, AO, BKSEL: Voltage

–0.5 to +6

V

Digital Input Pins, SCL, SDA, AO, BKSEL: Current

±10

mA

(2)

(V

–) – 0.5 to (V+) + 0.5

V

Continuous

Ambient Operating Temperature

–40 to +95

°C

Ambient Storage Temperature

–65 to +150

°C

Junction Temperature

+125

°C

Human Body Model

HBM

4000

V

ESD Rating

Charged Device Model

CDM

1000

V

Machine Model

MM

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

See the Output Protection section.

(3)

Short-circuit to ground, one amplifier per package.

2

Copyright

© 2009–2011, Texas Instruments Incorporated