LMV861, LMV862

SNOSAZ5A – FEBRUARY 2008 – REVISED JULY 2008

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

Human Body Model

2 kV

Charge-Device Model

1 kV

Machine Model

200V

± Supply Voltage

6V

Voltage at Input/Output Pins

−0.4V

Storage Temperature Range

−65°C to +150°C

+150°C

Soldering Information

Infrared or Convection (20 sec)

260°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC) Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

Operating Ratings

(1)

−40°C to +125°C

2.7V to 5.5V

Package Thermal Resistance (

5-Pin SC70

302°C/W

8-Pin VSSOP

217°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

3.3V Electrical Characteristics

(1)

Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

±273

±1000

μV

1260

Input Offset Voltage Temperature

±0.7

±2.6

μV/°C

0.1

10

pA

500

Input Offset Current

1

pA

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

(4)

The typical value is calculated by applying absolute value transform to the distribution, then taking the statistical average of the resulting

distribution

(5)

This parameter is guaranteed by design and/or characterization and is not tested in production.

2

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