HEF4020B

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© NXP B.V. 2011. All rights reserved.

Product data sheet

Rev. 8 — 18 November 2011

8 of 14

NXP Semiconductors

HEF4020B

14-stage binary counter

a. Input waveforms

b. Test circuit

Test data is given in Table 10.

Definitions for test circuit:

DUT = Device Under Test.

Fig 8.

Test circuit for measuring switching times

10 %

90 %

10 %

90 %

0 V

negative

pulse

positive

pulse

0 V

90 %

10 %

90 %

10 %

001aaj781

001aag182

DUT

CL

RT

G

Table 10.

Test data

Supply voltage

Input

Load

5 V to 15 V

 20 ns

50 pF