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DS25CP102 Datasheet(PDF) 3 Page - Texas Instruments |
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DS25CP102 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 19 page DS25CP102 www.ti.com SNLS262D – OCTOBER 2007 – REVISED MAY 2011 Pin Functions Pin Descriptions Pin Name Pin I/O, Type Pin Description Number IN0+, IN0- , 1, 2, I, LVDS Inverting and non-inverting high speed LVDS input pins. IN1+, IN1- 3, 4 OUT0+, OUT0-, 12, 11, O, LVDS Inverting and non-inverting high speed LVDS output pins. OUT1+, OUT1- 10, 9 SEL0, SEL1 7, 8 I, LVCMOS Switch configuration pins. There is a 20k pulldown resistor on this pin. EN0, EN1 14, 13 I, LVCMOS Output enable pins. There is a 20k pulldown resistor on this pin. PE 15 I, LVCMOS Transmit Pre-Emphasis select pin. There is a 20k pulldown resistor on this pin. EQ 6 I, LVCMOS Receive Equalization select pin. There is a 20k pulldown resistor on this pin. VDD 16 Power Power supply pin. GND 5, DAP Power Ground pin and Device Attach Pad (DAP) ground. These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) Supply Voltage −0.3V to +4V LVCMOS Input Voltage −0.3V to (VCC + 0.3V) LVDS Input Voltage −0.3V to +4V Differential Input Voltage |VID| 1.0V LVDS Output Voltage −0.3V to (VCC + 0.3V) LVDS Differential Output Voltage 0V to 1.0V LVDS Output Short Circuit Current Duration 5 ms Junction Temperature +150°C Storage Temperature Range −65°C to +150°C Lead Temperature Range Soldering (4 sec.) +260°C Maximum Package Power Dissipation at 25°C SQA Package 2.99W Derate SQA Package 23.9 mW/°C above +25°C Package Thermal Resistance θJA +41.8°C/W θJC +6.9°C/W ESD Susceptibility HBM (2) ≥8 kV MM (3) ≥250V CDM (4) ≥1250V (1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions. (2) Human Body Model, applicable std. JESD22-A114C (3) Machine Model, applicable std. JESD22-A115-A (4) Field Induced Charge Device Model, applicable std. JESD22-C101-C Copyright © 2007–2011, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: DS25CP102 |
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