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MBM29F160BE-70TN Datasheet(PDF) 10 Page - Fujitsu Component Limited. |
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MBM29F160BE-70TN Datasheet(HTML) 10 Page - Fujitsu Component Limited. |
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10 / 53 page  MBM29F160TE-55/-70/-90/MBM29F160BE-55/-70/-90 10 s FUNCTIONAL DESCRIPTION Read Mode The MBM29F160TE/BE has two control functions which must be satisfied in order to obtain data at the outputs. CE is the power control and should be used for a device selection. OE is the output control and should be used to gate data to the output pins if a device is selected. Address access time (tACC) is equal to the delay from stable addresses to valid output data. The chip enable access time (tCE) is the delay from stable addresses and stable CE to valid data at the output pins. The output enable access time is the delay from the falling edge of OE to valid data at the output pins. (Assuming the addresses have been stable for at least tACC - tOE time.) When reading out a data without changing addresses after power-u, it is necessary to input hardware reset or change CE pin from "H" tp "L". Standby Mode There are two ways to implement the standby mode on the MBM29F160TE/BE devices. One is by using both the CE and RESET pins; the other via the RESET pin only. When using both pins, a CMOS standby mode is achieved with CE and RESET inputs both held at VCC ±0.3 V. Under this condition the current consumed is less than 5 µA max. During Embedded Algorithm operation, VCC Active current (ICC2) is required even CE = “H”. The device can be read with standard access time (tCE) from either of these standby modes. When using the RESET pin only, a CMOS standby mode is achieved with the RESET input held at VSS ±0.3 V (CE = “H” or “L”). Under this condition the current consumed is less than 5 µA max. Once the RESET pin is taken high, the device requires tRH of wake up time before outputs are valid for read access. In the standby mode, the outputs are in the high-impedance state, independent of the OE input. Output Disable If the OE input is at a logic high level (VIH), output from the device is disabled. This will cause the output pins to be in a high-impedance state. Autoselect The Autoselect mode allows the reading out of a binary code from the device and will identify its manufacturer and type. The intent is to allow programming equipment to automatically match the device to be programmed with its corresponding programming algorithm. The Autoselect command may also be used to check the status of write-protected sectors. (See Tables 4.1 and 4.2.) This mode is functional over the entire temperature range of the device. To activate this mode, the programming equipment must force VID (11.5 V to 12.5 V) on address pin A9. Two identifier bytes may then be sequenced from the devices outputs by toggling address A0 from VIL to VIH. All addresses are DON’T CARES except A0, A1, and A6 (A-1). (See Table 2 or Table 3.) The manufacturer and device codes may also be read via the command register, for instances when the MBM29F160TE/BE is erased or programmed in a system without access to high voltage on the A9 pin. The command sequence is illustrated in Table 6, Command Definitions. Byte 0 (A0 = VIL) represents the manufacture’s code (Fujitsu = 04H) and byte 1 (A0 = VIH) represents the device identifier code (MBM29F160TE = D2H and MBM29F160BE = D8H for x 8 mode; MBM29F160TE = 22D2H and MBM29F160BE = 22D8H for x 16 mode). These two bytes/words are given in the Table 4.1 and 4.2. All identifiers for manufactures and device will exhibit odd parity with DQ7 defined as the parity bit. In order to read the proper device codes when executing the Autoselect, A1 must be VIL. (See Tables 4.1 and 4.2.) |
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