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AFE5801 Datasheet(PDF) 2 Page - Texas Instruments |
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AFE5801 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 47 page Serial Interface TimeGainBlock CLKINP CLKINM PLL BitClock FrameClock FCLKP FCLKM DCLKP DCLKM AVDD3 AVDD18 DVDD18 f CLKIN 6 f ´ CLKIN ADC1 Serializer LVDS AAF IN1 D1P D1M Control Memory ADC2 Serializer AAF IN2 D2P D2M ADC3 Serializer AAF IN3 D3P D3M · · · · · · · · · · · · ADC8 Serializer AAF IN8 D8P D8M B0328-01 VCM AVSS DVSS AFE5801 SLOS591D – SEPTEMBER 2008 – REVISED MAY 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. BLOCK DIAGRAM 2 Submit Documentation Feedback Copyright © 2008–2010, Texas Instruments Incorporated Product Folder Link(s): AFE5801 |
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