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5962F9553601VPA Datasheet(PDF) 6 Page - Texas Instruments |
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5962F9553601VPA Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 31 page  LM7171QML, LM7171QML-SP SNOSAR5C – FEBRUARY 2009 – REVISED APRIL 2013 www.ti.com LM7171 (±15) Electrical Characteristics AC Parameters (1) (2) The following conditions apply, unless otherwise specified. AC: TJ = 25°C, V + = +15V, V− = −15V, V CM = 0V, and RL > 1MΩ Sub- Symbol Parameter Conditions Notes Min Max Units groups SR Slew Rate AV = 2, VI = ±2.5V See(3)(4) 2000 V/µS 4 3nS Rise & Fall time GBW Unity-Gain Bandwidth See(5) 170 MHz 4 (1) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table. These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are specified only for the conditions as specified in MIL-STD-883, per Test Method 1019, Condition A. (2) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table. Low dose rate testing has been peformed on a wafer-by-wafer basis, per Test Method 1019, Condition D of MIL- STD-883, with no enhanced low dose rate sensitivity (ELDRS). (3) See AN00001 for SR test circuit. (4) Slew Rate measured between ±4V. (5) See AN00002 for GBW test circuit. LM7171 (±15) Electrical Characteristics DC Drift Parameters (1) (2) The following conditions apply, unless otherwise specified. DC: TJ = 25°C, V + = +15V, V− = −15V, V CM = 0V, and RL > 1MΩ Delta calculations performed on QMLV devices at group B , subgroup 5. Sub- Symbol Parameter Conditions Notes Min Max Units groups VIO Input Offset Voltage -250 250 µV 1 +IBias Input Bias Current -500 500 nA 1 -IBias Input Bias Current -500 500 nA 1 (1) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table. These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters are specified only for the conditions as specified in MIL-STD-883, per Test Method 1019, Condition A. (2) Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table. Low dose rate testing has been peformed on a wafer-by-wafer basis, per Test Method 1019, Condition D of MIL- STD-883, with no enhanced low dose rate sensitivity (ELDRS). 6 Submit Documentation Feedback Copyright © 2009–2013, Texas Instruments Incorporated Product Folder Links: LM7171QML LM7171QML-SP |
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