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ADC12130CIWM Datasheet(PDF) 6 Page - Texas Instruments |
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ADC12130CIWM Datasheet(HTML) 6 Page - Texas Instruments |
6 / 52 page ADC12130, ADC12132, ADC12138 SNAS098G – MARCH 2000 – REVISED MARCH 2013 www.ti.com Package Thermal Resistance Part Number Thermal Resistance ( θJA) ADC12130CIN 53°C/W ADC12130CIWM 70°C/W ADC12132CIMSA 134°C/W ADC12132CIWM 64°C/W ADC121038CIN 40°C/W ADC121038CIMSA 97°C/W ADC12138CIWM 50°C/W Some of these product/package combinations are obsolete and are shown here for reference only. Check the TI web site for availability. Converter Electrical Characteristics The following specifications apply for (V + = V A+ = VD+ = +5V, VREF+ = +4.096V, and fully differential input with fixed 2.048V common-mode voltage) or (V + = V A+ = VD+ = 3.3V, VREF+ = 2.5V and fully-differential input with fixed 1.250V common-mode voltage), VREF− = 0V, 12-bit + sign conversion mode (1), source impedance for analog inputs, V REF − and V REF + ≤ 25Ω, f CK = fSK = 5 MHz, and 10 (tCK) acquisition time unless otherwise specified. Boldface limits apply for TA = TJ = TMIN to TMAX; all other limits TA = TJ = 25°C. (2) (3) (4) Units Parameter Test Conditions Typical (5) Limits (6) (Limits) STATIC CONVERTER CHARACTERISTICS Resolution with No Missing Codes 12 + sign Bits (min) ILE Integral Linearity Error After Auto Cal (7) (8) ±1/2 ±2 LSB (max) DNL Differential Non-Linearity After Auto Cal ±1.5 LSB (max) Positive Full-Scale Error After Auto Cal (7) (8) ±1/2 ±3.0 LSB (max) Negative Full-Scale Error After Auto Cal (7)(8) ±1/2 ±3.0 LSB (max) After Auto Cal (9)(8) Offset Error ±1/2 ±2 LSB (max) VIN(+) = VIN(−) = 2.048V (1) The “12-Bit Conversion of Offset” and “12-Bit Conversion of Full-Scale” modes are intended to test the functionality of the device. Therefore, the output data from these modes are not an indication of the accuracy of a conversion result. (2) Two on-chip diodes are tied to each analog input through a series resistor as shown below. Input voltage magnitude up to 5V above VA+ or 5V below GND will not damage this device. However, errors in conversion can occur (if these diodes are forward biased by more than 50 mV) if the input voltage magnitude of selected or unselected analog input go above VA+ or below GND by more than 50 mV. As an example, if VA+ is 4.5 VDC, full-scale input voltage must be ≤4.55 VDC to ensure accurate conversions. (3) To ensure accuracy, it is required that the VA+ and VD+ be connected together to the same power supply with separate bypass capacitors at each V+ pin. (4) With the test condition for VREF (VREF+ − VREF−) given as +4.096V, the 12-bit LSB is 1.0 mV. For VREF = 2.5V, the 12-bit LSB is 610 μV. (5) Typical figures are at TJ = TA = 25°C and represent most likely parametric norm. (6) Tested limits are specified to TI's AOQL (Average Outgoing Quality Level). (7) Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive full-scale and zero. For negative integral linearity error, the straight line passes through negative full-scale and zero (see Figure 5 and Figure 6). (8) The ADC12130 family's self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self- calibration process will result in a maximum repeatability uncertainty of 0.2 LSB. (9) The human body model is a 100 pF capacitor discharged through a 1.5 k Ω resistor into each pin. 6 Submit Documentation Feedback Copyright © 2000–2013, Texas Instruments Incorporated Product Folder Links: ADC12130 ADC12132 ADC12138 |
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