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DS3923 Datasheet(PDF) 2 Page - Maxim Integrated Products |
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DS3923 Datasheet(HTML) 2 Page - Maxim Integrated Products |
2 / 15 page Voltage on HVD, MIRIN, MIRCAP, and MIROUT Relative to HVGND ..........................................-0.3V to +79V Voltage on VCC and AVCC to GND ....................-0.3V to + 4.3V Voltage on All Other Pins Relative to GND...................-0.3V to (VCC + 0.3V) Not to Exceed +4V Continuous Power Dissipation (TA = +70°C) TQFN (derate 15.4mW/°C above +70°C)...............1228.9mW Storage Temperature Range............................ -65°C to +150°C Lead Temperature (soldering, 10s) .................................+300°C Soldering Temperature (reflow).......................................+260°C Electrical Characteristics (VMIRIN = 15V to 76V, VCC = 2.85V to 3.63V, TA = -40°C to +95°C, unless otherwise noted.) (Note 1) PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS Low Voltage Supply VCC 2.85 3.63 V Low Voltage Current ICC (Note 2) 8 16 mA MIRIN Quiescent Current IMIRIN VMIRIN = 60V, ISRC/SHDN = 30kΩ to GND IMIROUT = 0µA 1 2 mA IMIROUT = 1mA 3.2 4 MIRIN Voltage VMIRIN 15 76 V HV FET On-Resistance RDSONHV VGS = 3.0V, ID = 170mA 0.85 2 Ω HVG Voltage VGSHV 0 VCC + 0.3 V HVD Voltage VDHV 76 V HVD Leakage IILHV -1 +1 µA Logic-Input Thresholds (DIFFEN, DISCHARGE, GAIN, HVG, SEN, SENXOR) VIL 0.3 x VCC V VIH 0.7 x VCC ISRC/SHDN Threshold VIL_SHDN 1.4 V VIH_SHDN VCC - 0.2 ISRC/SHDN Resistor RISRC (Note 3 29.7 30 30.3 kΩ Maximum MIROUT Current ICLAMP ISRC/SHDN = low RLIM = 40.2kΩ 1.4 2 2.8 mA RLIM = 24.9kΩ 2.5 3.2 4.1 ISRC/SHDN = high 0.01 MIROUT Capacitive Load CMIROUT Total capacitance on MIROUT to achieve accuracy specification 330 500 pF Logic Output Levels (ILIMS) VOL_ILIMS IILIMS = -2mA 0.45 V VOH_ILIMS IILIMS = +2mA VCC -0.45 DS3923 High-Speed Current Mirror with Sample/Hold Output www.maximintegrated.com Maxim Integrated │ 2 Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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