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2N7002KU Datasheet(PDF) 6 Page - Silikron Semiconductor Co.,LTD. |
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2N7002KU Datasheet(HTML) 6 Page - Silikron Semiconductor Co.,LTD. |
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6 / 7 page  2N7002KU ©Silikron Semiconductor CO., LTD. 2012.04.20 Version: 1.0 page 6 of 7 www.silikron.com Ordering and Marking Information Device Marking: U72 Package (Available) SOT-23 Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type Units/ Tape Tapes/Inner Box Units/Inner Box Inner Boxes/Carton Box Units/ Carton Box SOT-23 3000 10 30000 4 120000 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices High Temperature Gate Bias(HTGB) Tj=150℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices |
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