IDT49C460DFFB datasheet(6/32 Pages) IDT

Part #	IDT49C460DFFB

Description	32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT

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Manufacturer	IDT [Integrated Device Technology]

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IDT49C460/A/B/C/D/E

32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT

MILITARY AND COMMERCIAL TEMPERATURE RANGES

EDC ARCHITECTURE SUMMARY

The IDT49C460s are high-performance cascadable EDCs

used for check bit generation, error detection, error correction

and diagnostics. The function blocks for this 32-bit device

consist of the following:

• Data Input Latch

• Check Bit Input Latch

• Check Bit Generation Logic

• Syndrome Generation Logic

• Error Detection Logic

• Error Correction Logic

• Data Output Latch

• Diagnostic Latch

• Control Logic

DATA INPUT/OUTPUT LATCH

The Latch Enable Input, LEIN, controls the loading of 32 bits

of data to the Data In Latch. The data from the DATA lines can

be loaded in the Diagnostic Latch under control of the

Diagnostic Latch Enable, LEDIAG, giving check bit information

in one byte and control information in another byte. The

Diagnostic Latch is used in the Internal Control Mode or in one

of the diagnostic modes. The Data Output Latch has buffers

that place data on the DATA lines. These buffers are split into

four 8-bit buffers, each having their own output enable con-

trols.

This feature facilitates byte read and byte modify

operations.

CHECK BIT GENERATION LOGIC

This generates the appropriate check bits for the 32 bits of

data in the Data Input Latch. The modified Hamming Code is

the basis for generating the proper check bits.

SYNDROME GENERATION LOGIC

In both the Detect and Correct modes, this logic does a

comparison on the check bits read from memory against the

newly generated set of check bits produced for the data read

in from memory. Matching sets of check bits mean no error

was detected. If there is a mismatch, one or more of the data

or check bits is in error. Syndrome bits are produced by an

exclusive-OR of the two sets of check bits. Identical sets of

check bits mean the syndrome bits will be all zeros. If an error

results, the syndrome bits can be decoded to determine the

number of errors and the specific bit-in-error.

ERROR DETECTION LOGIC

This part of the device decodes the syndrome bits

generated by the Syndrome Generation Logic. With no errors

in either the input data or check bits, both the

ERROR and

MULTERROR outputs are HIGH. ERROR will go low if one

error is detected.

MULTERROR and ERROR will both go low

if two or more errors are detected.

ERROR CORRECTION LOGIC

In single error cases, this logic complements (corrects) the

single data bit-in-error. This corrected data is loaded into the

Data Output Latch, which can then be read onto the bidirec-

tional data lines. If the error is resulting from one of the check

bits, the correction logic does not place corrected check bits

on the syndrome/check bit outputs. If the corrected check bits

are needed, the EDC must be switched to the Generate Mode.

DATA OUTPUT LATCH AND OUTPUT BUFFERS

The Data Output Latch is used for storing the result of an

error correction operation.

The latch is loaded from the

correction logic under control of the Data Output Latch En-

able, LEOUT. The Data Output Latch may also be directly

loaded from the Data Input Latch in the PASSTHRU mode.

The Data Output Latch buffer is split into 4 individual buffers

which can be enabled by

OE0–3 separately for reading onto

the bidirectional data lines.

DIAGNOSTIC LATCH

The diagnostic latch is loadable under control of the

Diagnostic Latch Enable, LEDIAG, from the bidirectional data

lines. Check bit information is contained in one byte while the

other byte contains the control information. The Diagnostic

Latch is used for driving the device when in the Internal Control

Mode, or for supplying check bits when in one of the diagnostic

modes.

CONTROL LOGIC

Specifies in which mode the device will be operating in.

Normal operation is when the control logic is driven by external

control inputs. In the Internal Control Mode, the control signals

are read from the

Diagnostic Latch.

Since LEOUT and

GENERATE are controlled by the same pin, the latching action

(LEOUT from high to low) of the Data Output Latch causes the

EDC to go into the Generate Mode.

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IDT49C460DFFB Datasheet(PDF) 6 Page - Integrated Device Technology

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