IDT71342SA/LA

HIGH-SPEED 4K x 8 DUAL-PORT STATIC RAM WITH SEMAPHORE

COMMERCIAL TEMPERATURE RANGE

6.05

4

DATA RETENTION CHARACTERISTICS

Symbol

Parameter

Test Condition

Min.

Typ.

(1)

Max.

Unit

VCC for Data Retention

—

2.0

—

—

V

Data Retention Current

COM’L.

—

100

1500

µA

(3)

Chip Deselect to Data Retention Time

0—

—

ns

(3)

Operation Recovery Time

(2)

——

ns

2721 tbl 07

NOTES:

°C, and are not production tested.

3. This parameter is guaranteed by device characterization, but is not production tested.

DATA RETENTION WAVEFORM

AC TEST CONDITIONS

Input Pulse Levels

GND to 3.0V

Input Rise/Fall Times

5ns

Input Timing Reference Levels

1.5V

Output Reference Levels

1.5V

Output Load

Figures 1 and 2

2721 tbl 08

CE

DATA RETENTION MODE

4.5V

4.5V

≥ 2V

2721 drw 04

+5V

1250

Ω

30pF

775

Ω

2721 drw 05

+5V

1250

Ω

5pF *

775

Ω

2721 drw 06

Figure 2. Output Test Load

*Including scope and jig

Figure 1. AC Output Test Load