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IDT7142LA20J Datasheet(PDF) 7 Page - Integrated Device Technology

Part # IDT7142LA20J
Description  HIGH-SPEED 2K x 8 DUAL-PORT STATIC RAM
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT7142LA20J Datasheet(HTML) 7 Page - Integrated Device Technology

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6.02
7
IDT7132SA/LA AND IDT7142SA/LA
HIGH-SPEED 2K x 8 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TIMING WAVEFORM OF WRITE CYCLE NO. 1, (R/
W
W
W
W
W CONTROLLED TIMING)(1,5,8)
TIMING WAVEFORM OF WRITE CYCLE NO. 2, (
CE
CE
CE
CE
CE CONTROLLED TIMING)(1,5)
NOTES:
1. R/
W or CE must be High during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of
CE = VIL and R/W= VIL.
3. tWR is measured from the earlier of
CE or R/W going High to the end of the write cycle.
4. During this period, the l/O pins are in the output state and input signals must not be applied.
5. If the
CE Low transition occurs simultaneously with or after the R/W Low transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal (
CE or R/W) is asserted last.
7. This parameter is determined be device characterization, but is not production tested. Transition is measured +/- 500mV from steady state
with the Output Test Load (Figure 2).
8. If
OE is low during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off
data to be placed on the bus for the required tDW. If
OE is High during a R/W controlled write cycle, this requirement does not apply and the
write pulse can be as short as the specified tWP.
tWC
ADDRESS
OE
CE
R/
W
DATA OUT
DATA IN
tAS
tOW
tDW
tDH
tAW
tWP(2)
tHZ
(4)
(4)
tWZ
tHZ
2692 drw 09
(6)
(7)
(7)
(3)
(7)
tWR
tWC
ADDRESS
CE
R/
W
DATA IN
tAS
tEW
tWR
tDW
tDH
tAW
2692 drw 10
(6)
(2)
(3)


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