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IDT72041L30J Datasheet(PDF) 3 Page - Integrated Device Technology

Part # IDT72041L30J
Description  CMOS ASYNCHRONOUS FIFO WITH RETRANSMIT 1K x 9, 2K x 9, 4K x 9
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT72041L30J Datasheet(HTML) 3 Page - Integrated Device Technology

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5.09
3
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT72021, IDT72031, IDT72041
CMOS ASYNCHRONOUS FIFO WITH RETRANSMIT 1K x 9, 2K x 9, 4K x 9
RECOMMENDED DC
OPERATING CONDITIONS
Symbol
Parameter
Min.
Typ.
Max.
Unit
VCCM
Military Supply
4.5
5.0
5.5
V
Voltage
VCCC
Commercial
4.5
5.0
5.5
V
Supply Voltage
GND
Supply Voltage
0
0
0
V
VIH
Input High Voltage
2.0
V
Commercial
VIH
Input High Voltage
2.2
V
Military
VIL
(1)
Input Low Voltage
0.8
V
Commercial and
Military
NOTE:
2677 tbl 05
1. 1.5V undershoots are allowed for 10ns once per cycle.
STATUS FLAG
Number of Words in FIFO
1K
2K
4K
FF AEF HF
EF
00
0
H
L
H
L
1-127
1-255
1-511
H
L
H
H
128-512
256-1024
512-2048
HHHH
513-896
1025-1792
2049-3584
H
H
L
H
897-1023
1793-2047
3585-4095
H
L
L
H
1024
2048
4096
L
L
L
H
CAPACITANCE (TA = +25
°C, f = 1.0 MHz)
Symbol
Parameter
(1)
Condition
Max.
Unit
CIN
Input Capacitance
VIN = 0V
10
pF
COUT
Output Capacitance
VOUT = 0V
10
pF
NOTE:
2677 tbl 03
1. These parameters are sampled and not 100% tested.
2677 tbl l 02
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
Com’l.
Mil.
Unit
VTERM
Terminal Voltage
–0.5 to +7.0 –0.5 to +7.0
V
with Respect
to GND
TA
Operating
0 to +70
–55 to +125
°C
Temperature
TBIAS
Temperature
–55 to +125 –65 to +135
°C
Under Bias
TSTG
Storage
–55 to +125 –65 to +155
°C
Temperature
IOUT
DC Output
50
50
mA
Current
NOTE:
2677 tbl 04
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliabilty.


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