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IDT54FCT3827AP Datasheet(PDF) 2 Page - Integrated Device Technology |
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IDT54FCT3827AP Datasheet(HTML) 2 Page - Integrated Device Technology |
2 / 7 page IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES 8.15 2 DIP/SOIC/SSOP/QSOP TOP VIEW PIN CONFIGURATIONS 3092 drw 02 PIN DESCRIPTION 3092 tbl 01 ABSOLUTE MAXIMUM RATINGS (1) Symbol Rating Commercial Military Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +4.6 –0.5 to +4.6 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to +7.0 –0.5 to +7.0 V VTERM(4) Terminal Voltage with Respect to GND –0.5 to VCC + 0.5 –0.5 to VCC + 0.5 V TA Operating Temperature –40 to +85 –55 to +125 °C TBIAS Temperature Under Bias –55 to +125 –65 to +135 °C TSTG Storage Temperature –55 to +125 –65 to +150 °C PT Power Dissipation 1.0 1.0 W IOUT DC Output Current –60 to +60 –60 to +60 mA 3092 lnk 03 3092 tbl 02 CAPACITANCE (TA = +25 °C, f = 1.0MHz) NOTE: 1. This parameter is measured at characterization but not tested. 3092 lnk 04 Symbol Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 3.5 6.0 pF COUT Output Capacitance VOUT = 0V 4.0 8.0 pF Names I/O Description OEI I When both are LOW the outputs are enabled. When either one or both are HIGH the outputs are High Z. DI I 10-bit data input. YI O 10-bit data output. Inputs Output OE OE1 OE OE2 DI YI Function L L L L L H L H Transparent H X X H X X Z Z Three-State OE1 D0 D1 D2 D3 D4 D5 D6 D7 Y0 Y1 Y2 Y3 Y4 Y6 Y5 Y7 VCC 1 2 3 4 5 6 7 8 9 10 13 14 15 16 17 18 19 20 P24-1 D24-1 SO24-2 SO24-7 & SO24-8 11 12 21 22 23 24 D8 D9 Y8 Y9 OE2 GND FUNCTION TABLE (1) NOTE: 1. H = HIGH Voltage Level X = Don’t Care L = LOW Voltage Level Z = High Impedance NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT- INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for ex- tended periods may affect reliability. 2. Vcc terminals. 3. Input terminals. 4. Output and I/O terminals. |
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