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IDT7M1024S30G Datasheet(PDF) 4 Page - Integrated Device Technology |
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IDT7M1024S30G Datasheet(HTML) 4 Page - Integrated Device Technology |
4 / 8 page 7.4 4 IDT7M1024 4K x 36 BiCMOS SYNCHRONOUS DUAL-PORT STATIC RAM MODULE MILITARY AND COMMERCIAL TEMPERATURE RANGES DC ELECTRICAL CHARACTERISTICS OVER THE OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE (VCC = 5V ± 10%) IDT7M1024SxxG, IDT7M1024SxxGB –20 –25 –30 Symbol Parameter Test Condition Version Typ. Max. Typ. Max. Typ. Max. Unit ICC Dynamic CE ≤ VIL Mil. — — — 1480 — 1440 mA Operating Outputs Open Current (Both f = fMAX (1) Com’l. — 1440 — 1360 — — Ports Active) ISB1 Standby L_ CE and Mil. — — — 680 — 560 mA Current (Both R_ CE ≥ VIH Ports—TTL f = fMAX (1) Com’l. — 720 — 640 — — Level Inputs) ISB2 Standby L_ CE or R_CE ≥ VIH Mil. — — — 1080 — 1000 mA Current (One Active Port Port—TTL Outputs Open, Com’l. — 1080 — 1000 — — Level Inputs) f = fMAX (1) ISB3 Full Standby Both Ports R_ CE Mil. — — — 80 — 80 mA Current (Both and L_ CE ≥ VCC – 0.2V Ports—CMOS VIN ≥ VCC – 0.2V Com’l. — 80 — 80 — — Level Inputs) or VIN ≤ 0.2V, f = 0(2) ISB4 Full Standby One Port L_ CE or R_CE ≥ Mil. — — — 1040 — 960 mA Current (One VCC – 0.2V, VIN ≥ VCC – 0.2V Port—CMOS or VIN ≤ 0.2V, Active Port Com’l. — 1040 — 960 — — Level Inputs) Outputs Open, f = fMAX (1) NOTES: 2809 tbl 09 1. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCLK, and using “AC TEST CONDITIONS” of input levels of GND to 3V. 2. f = 0 means no address, clock, or control lines change. Applies only to inputs at CMOS level standby. DC ELECTRICAL CHARACTERISTICS OVER THE OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE (VCC = 5.0V ± 10%) IDT7M1024 Symbol Parameter Test Condition Min. Max. Unit |ILI| Input Leakage Current VCC = 5.5V, VIN = 0V to VCC —40 µA |ILO| Output Leakage Current CE = VIH, VOUT = 0V to VCC —10 µA VOL Output LOW Voltage IOL = 4mA — 0.4 V VOH Output HIGH Voltage IOH = –4mA 2.4 — V 2809 tbl 08 |
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