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CD82C88 Datasheet(PDF) 6 Page - Intersil Corporation |
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CD82C88 Datasheet(HTML) 6 Page - Intersil Corporation |
6 / 10 page 4-338 AC Testing Input, Output Waveform A.C. Testing: All input signals (other than CLK) must switch between VIL -0.4V and VIH +0.4. CLK must switch between 0.4V and VCC -0.4V. Input rise and fall times are driven at 1ns/V. A.C. Test Circuit AC Electrical Specifications VCC = 5.0V ± 10%; TA = 0 oC to +70oC (C82C88); TA = -40 oC to +85oC (I82C88); TA = -55 oC to +125oC (M82C88) SYMBOL PARAMETER 8MHz 10MHz 12MHz UNITS TEST CONDITIONS MIN MAX MIN MAX MIN MAX TIMING REQUIREMENTS (1) TCLCL CLK Cycle Period 125 - 100 - 83 - ns (2) TCLCH CLK Low Time 55 - 50 - 34 - ns (3) TCHCL CLK High Time 40 - 37 - 34 - ns (4) TSVCH Status Active Setup Time 35 - 35 - 35 - ns (5) TCHSV Status Inactive Hold Time 10 - 10 - 5 - ns (6) TSHCL Status Inactive Setup Time 35 - 35 - 35 - ns (7) TCLSH Status Active Hold Time 10 - 10 - 5 - ns TIMING RESPONSES (8) TCVNV Control Active Delay 5 45 5 45 5 45 ns 1 (9) TCVNX Control Inactive Delay 10 45 10 45 10 35 ns 1 (10) TCLLH ALE Active Delay (from CLK) - 20 - 20 - 20 ns 1 (11) TCLMCH MCE Active Delay (from CLK) - 25 - 23 - 23 ns 1 (12) TSVLH ALE Active Delay (from Status) - 20 - 20 - 20 ns 1 (13) TSVMCH MCE Active Delay (from Status) - 30 - 23 - 23 ns 1 (14) TCHLL ALE Inactive Delay 4 18 4 18 4 18 ns 1 (15) TCLML Command Active Delay 5 35 5 35 5 35 ns 2 (16) TCLMH Command Inactive Delay 5 35 5 35 5 35 ns 2 (17) TCHDTL Direction Control Active Delay - 50 - 50 - 50 ns 1 (18) TCHDTH Direction Control Inactive Delay - 30 - 30 - 30 ns 1 (19) TAELCH Command Enable Time (Note 1) - 40 - 40 - 40 ns 3 (20) TAEHCZ Command Disable Time (Note 2) -40-40 -40 ns 4 (21) TAELCV Enable Delay Time 110 250 110 250 110 250 ns 2 (22) TAEVNV AEN to DEN - 25 - 25 - 25 ns 1 (23) TCEVNV CEN to DEN, PDEN - 25 - 25 - 25 ns 1 (24) TCELRH CEN to Command - TCLML +10 - TCLML - TCLML ns 2 (25) TLHLL ALE High Time TCLCH - 10 - TCLCH - 10 - TCLCH - 10 nns 1 NOTES: 1. TAELCH measurement is between 1.5V and 2.5V. 2. TAEHCZ measured at 0.5V change in VOUT. 1.5V 1.5V VIL -0.4V INPUT VIH +0.4V VOL OUTPUT VOH TABLE 2. TEST CONDITION DEFINITION TABLE TEST CONDITION V1 R1 C1 1 2.13V 220 Ω 80pF 2 2.29V 91 Ω 300pF 3 1.5V 187 Ω 300pF 4 1.5V 187 Ω 50pF TEST POINT V1 C1 (SEE NOTE) R1 OUTPUT FROM DEVICE UNDER TEST NOTE: INCLUDES STRAY AND JIG CAPACITANCE 82C88 |
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Similar Description - CD82C88 |
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