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HI7188 Datasheet(PDF) 9 Page - Intersil Corporation |
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HI7188 Datasheet(HTML) 9 Page - Intersil Corporation |
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9 / 22 page  7-1855 Definitions Integral Non-Linearity (INL) - This is the maximum devia- tion of any digital code from a straight line passing through the endpoints of the transfer function. The endpoints of the trans- fer function are zero scale (a point 0.5 LSB below the first code transition 000...000 and 000...001) and full scale (a point 0.5 LSB above the last code transition 111...110 to 111...111). Differential Non-Linearity (DNL) - This is the deviation from the actual difference between midpoints and the ideal difference between midpoints (1 LSB) for adjacent codes. If this difference is equal to or more negative than 1 LSB, a code will be missed. Offset Error (VOS) - The offset error is the deviation of the first code transition from the ideal input voltage (VIN - 0.5 LSB). Full Scale Error (FSE) - The full scale error is the deviation of the last code transition from the ideal input full-scale volt- age (VIN- + VREF/Gain - 1.5 LSB). Input Span - The input span defines the minimum and max- imum input voltages the device can handle while still cali- brating properly for gain. End of Scan (EOS) - The end of scan is a signal used to indicate all active logical channels have been converted and data is available to be read. Line Noise Rejection - Line noise rejection is the ability to attenuate (reject) signals at the frequency of power lines typ- ically 50Hz or 60Hz. Physical/Logical Channel - A physical channel pertains to channels which are directly connected to the device package pins identified in the pinout. Logical channels are predefined in the Channel Configuration Registers (CCR) with a physical channels reference (address) being made by the user. Refer to the Channel Configuration Registers section for examples. FIGURE 5. DATA READ FROM HI7188 FIGURE 6. DATA READ FROM HI7188 Waveforms (Continued) CS SCLK SDIO SDO tACC tDV 1ST BIT 2ND BIT SCLK CS EOS SDIO tEOS 8 7 6 5 1 HI7188 |
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