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5962D9569401VEA Datasheet(PDF) 5 Page - Intersil Corporation |
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5962D9569401VEA Datasheet(HTML) 5 Page - Intersil Corporation |
5 / 6 page 5 HS-0549RH DYNAMIC BURN-IN AND LIFE TEST CIRCUIT V2 = +15.5V, ±.0.5V V3 = -15.5V, ±0.5V R1 = 10kΩ, ±5% C1 = 0.01µF minimum (per socket) D1 = 1N4002 or equivalent (per board) F0 = 100kHz, ±10%; F1 = F0/2; F2 = F1/2, 50% duty cycle, VIL = 0.8V Max; VIH = 4.0V Min HS-0549RH STATIC BURN-IN TEST CIRCUIT V1 = +5.5V, ±0.5V V2 = +15.5V, ±0.5V V3 = -15.5V, ±0.5V R1 = 10kΩ, ±10% C1 = 0.01µF minimum (per socket) D1 = 1N4002 or equivalent (per board) Burn-In/Life Test Circuits (Continued) 14 15 16 9 13 12 11 10 1 2 3 4 5 7 6 8 F0 F2 V2 V3 D1 C1 R1 R1 D1 C1 F1 14 15 16 9 13 12 11 10 1 2 3 4 5 7 6 8 V2 V3 D1 C1 R1 R1 D1 C1 V1 Irradiation Circuits HS-0549RH R1 = R2 = 10kΩ ±5% HS-0548RH R1 = 10kΩ ±5% 14 15 16 9 13 12 11 10 1 2 3 4 5 7 6 8 +5V -15V +1V R1 R2 +1V +15V 14 15 16 9 13 12 11 10 1 2 3 4 5 7 6 8 +5V -15V +1V R1 +1V +15V HS-0548RH, HS-0549RH |
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