HS1B-0508RH-Q datasheet(4/6 Pages) INTERSIL

Part #	HS1B-0508RH-Q

Description	Radiation Hardened Single 8/Differential 4-Channel CMOS Analog Multiplexers

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Manufacturer	INTERSIL [Intersil Corporation]

Direct Link	http://www.intersil.com/cda/home

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4 / 6 page

4

Burn-In/Life Test Circuits

HS-0508RH

DYNAMIC BURN-IN AND LIFE TEST CIRCUIT

V1 = -15V maximum, -16V minimum

V2 = +15V minimum, +16V maximum

R1 = 10k

Ω ±5% 1/4W

C1 = C2 = 0.01

µF minimum (per socket) or 0.1µF minimum (per row)

D1 = D2 = 1N4002 (or equivalent)

F0 = 100kHz 50% duty cycle; VIL = 0.8V max; VIH = 4.0V min.

F1 = F0/2

F2 = F1/2

F3 = F2/2

HS-0508RH

STATIC BURN-IN TEST CIRCUIT

V1 = 5V minimum, 6V maximum

V2 = -15V maximum, -16V minimum

V3 = +15V minimum, +16V maximum

R1 = 10k

Ω±5% 1/4W

C1 = C2 = 0.01

µF minimum (per socket) or 0.1µF minimum (per row)

D1 = D2 = 1N4002 (or equivalent)

HS-0509RH

DYNAMIC BURN-IN AND LIFE TEST CIRCUIT

V2 = +15.5V,

±.0.5V

V3 = -15.5V,

±0.5V

R1 = 10k

Ω, ±5%

C1 = 0.1

µF minimum (per socket)

D1 = 1N4002 or equivalent (per board)

F0 = 100kHz,

±10%; F1 = F0/2; F2 = F1/2, 50% duty cycle,

VIL = 0.8V max.; VIH = 4.0V min.

HS-0509RH

STATIC BURN-IN TEST CIRCUIT

V1 = +5.5V,

±0.5V

V2 = +15.5V,

±0.5V

V3 = -15.5V,

±0.5V

R1 = 10k

Ω, ±10%

C1 = 0.1

µF minimum (per socket)

D1 = 1N4002 or equivalent (per board)

14

15

16

9

13

12

11

10

1

2

3

4

5

7

6

8

F0

F3

V1

D1

C1

R1

F1

F2

V2

D2

C2

14

15

16

9

13

12

11

10

1

2

3

4

5

7

6

8

V2

D1

C1

R1

V1

V3

D2

C2

14

15

16

9

13

12

11

10

1

2

3

4

5

7

6

8

F0

F2

V2

V3

D1

C1

R1

D1

C1

F1

V2

V3

D1

C1

R1

D1

C1

V1

14

15

16

9

13

12

11

10

1

2

3

4

5

7

6

8

HS-0508RH, HS-0509RH

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HS1B-0508RH-Q Datasheet(PDF) 4 Page - Intersil Corporation

HS1B-0508RH-Q Datasheet(HTML) 4 Page - Intersil Corporation

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