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5962R9676601VXC Datasheet(PDF) 5 Page - Intersil Corporation |
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5962R9676601VXC Datasheet(HTML) 5 Page - Intersil Corporation |
5 / 14 page 5 Specifications HS-81C55RH, HS-81C56RH WRITE to Port Output TWP Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns Port Input Setup Time TPR Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC50 - ns Port Input Hold Time TRP Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC15 - ns Strobe to Buffer Full TSBF Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns Strobe Width TSS Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC 150 - ns READ to Buffer Empty TRBE Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns Strobe to INTR Off TSI Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns READ to INTR Off TRDI Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC 360 ns Port Setup Time to Strobe TPSS Notes 1, 4, 5 9, 10, 11 -55oC ≤ T A ≤ +125 oC 100 - ns Post Hold Time After Strobe TPHS Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC 100 - ns Strobe to Buffer Empty TSBE Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns WRITE to Buffer full TWBF Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns WRITE to INTR Off TWI Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 340 ns TIMER-IN to TIMER OUT Low TTL Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns TIMER-IN to TIMER-OUT High TTH Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC - 300 ns Data Bus Enable from READ Control TRDE Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC 120 - ns TIMER-IN Low Time T1 Notes 1, 4, 6 9, 10, 11 -55oC ≤ T A ≤ +125 oC40 - ns TIMER-IN High Time T2 Notes 1, 4 9, 10, 11 -55oC ≤ T A ≤ +125 oC 115 - ns NOTES: 1. All devices guaranteed at worst case limits and over radiation. 2. Operating supply current (IDDOP) is proportional to operating frequency. 3. Output timings are measured with purely capacitive load. 4. For design purposes the limits are given as shown. For compatibility with the 80C85RH microprocessor, the AC parameters are tested as maximums. 5. Parameter tested as part of the functional test. No read and record data available. 6. At low temperature, T1 is measured down to 10ns. If the reading is less than 10ns, the parameter will read 10ns. 7. Read and Record data available on failing data only. TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETERS SYMBOL CONDITIONS TEMPERATURE LIMITS UNITS MIN MAX Input Capacitance CIN VDD = Open, f = 1MHz, All measurements referenced to device ground TA = +25 oC - 10 pF I/O Capacitance CI/O VDD = Open, f = 1MHz, All measurements referenced to device ground TA = +25 oC - 12 pF Output Capacitance COUT VDD = Open, f = 1MHz, All measurements referenced to device ground TA = +25 oC - 10 pF Data Bus Float After READ TRDF VDD = 4.75V -55oC, +25oC, +125oC 10 100 ns Recovery Time Between Controls TRV VDD = 4.75V -55oC, +25oC, +125oC - 220 ns NOTE: The parameters listed in Table 3 are controlled via design or process parameters and are not directly tested. These parameters are characterized upon initial design release and upon design changes which would affect these characteristics. TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) PARAMETERS SYMBOL CONDITIONS GROUP A SUBGROUPS TEMPERATURE LIMITS UNITS MIN MAX Spec Number 518056 |
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