5

Specifications HS-81C55RH, HS-81C56RH

WRITE to Port Output

TWP

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

Port Input Setup Time

TPR

Notes 1, 4

9, 10, 11

≤ T

-

ns

Port Input Hold Time

TRP

Notes 1, 4

9, 10, 11

≤ T

-

ns

Strobe to Buffer Full

TSBF

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

Strobe Width

TSS

Notes 1, 4

9, 10, 11

≤ T

150

-

ns

READ to Buffer Empty

TRBE

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

Strobe to INTR Off

TSI

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

READ to INTR Off

TRDI

Notes 1, 4

9, 10, 11

≤ T

360

ns

Port Setup Time to Strobe

TPSS

Notes 1, 4, 5

9, 10, 11

≤ T

100

-

ns

Post Hold Time After Strobe

TPHS

Notes 1, 4

9, 10, 11

≤ T

100

-

ns

Strobe to Buffer Empty

TSBE

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

WRITE to Buffer full

TWBF

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

WRITE to INTR Off

TWI

Notes 1, 4

9, 10, 11

≤ T

-

340

ns

TIMER-IN to TIMER OUT Low

TTL

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

TIMER-IN to TIMER-OUT High

TTH

Notes 1, 4

9, 10, 11

≤ T

-

300

ns

Data Bus Enable from READ Control

TRDE

Notes 1, 4

9, 10, 11

≤ T

120

-

ns

TIMER-IN Low Time

T1

Notes 1, 4, 6

9, 10, 11

≤ T

-

ns

TIMER-IN High Time

T2

Notes 1, 4

9, 10, 11

≤ T

115

-

ns

NOTES:

1. All devices guaranteed at worst case limits and over radiation.

2. Operating supply current (IDDOP) is proportional to operating frequency.

3. Output timings are measured with purely capacitive load.

4. For design purposes the limits are given as shown. For compatibility with the 80C85RH microprocessor, the AC parameters are tested

as maximums.

5. Parameter tested as part of the functional test. No read and record data available.

6. At low temperature, T1 is measured down to 10ns. If the reading is less than 10ns, the parameter will read 10ns.

7. Read and Record data available on failing data only.

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS

PARAMETERS

SYMBOL

CONDITIONS

TEMPERATURE

LIMITS

UNITS

MIN

MAX

Input Capacitance

CIN

VDD = Open, f = 1MHz, All measurements

referenced to device ground

-

10

pF

I/O Capacitance

CI/O

VDD = Open, f = 1MHz, All measurements

referenced to device ground

-

12

pF

Output Capacitance

COUT

VDD = Open, f = 1MHz, All measurements

referenced to device ground

-

10

pF

Data Bus Float After

READ

TRDF

VDD = 4.75V

10

100

ns

Recovery Time Between

Controls

TRV

VDD = 4.75V

-

220

ns

NOTE: The parameters listed in Table 3 are controlled via design or process parameters and are not directly tested. These parameters are

characterized upon initial design release and upon design changes which would affect these characteristics.

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS

(Continued)

PARAMETERS

SYMBOL

CONDITIONS

GROUP A

SUBGROUPS

TEMPERATURE

LIMITS

UNITS

MIN

MAX

Spec Number

518056