LTC3534

3

3534fb

For more information www.linear.com/LTC3534

elecTrical characTerisTics

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: The LTC3534E is guaranteed to meet performance specifications

from 0°C to 85°C. Specifications over the –40°C to 85°C operating

temperature range are assured by design, characterization and correlation

with statistical process controls.

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Input Start-Up Voltage

l

2.2

2.4

V

Input Operating Range

l

2.4

7

V

Output Voltage Adjust Range

l

1.8

7

V

Feedback Voltage

(Note 4)

l

0.975

1

1.015

V

Feedback Input Current

1

50

nA

Operation

25

50

µA

0.1

1

µA

420

700

µA

Input Current Limit

l

1

1.8

A

Reverse Current Limit

500

mA

Burst Current Limit

400

mA

NMOS Switches Leakage

Switches B and C

0.1

7

µA

PMOS Switches Leakage

Switches A and D

0.1

10

µA

PMOS Switches On-Resistance

Switches A and D

260

mΩ

NMOS B Switch On-Resistance

Switch B

275

mΩ

NMOS C Switch On-Resistance

Switch C

215

mΩ

Maximum Duty Cycle

Boost (% Switch C On)

Buck (% Switch A On)

l

l

75

100

85

%

%

Minimum Duty Cycle

l

0

%

Frequency

l

0.80

1

1.15

MHz

(Note 4)

74

dB

Error Amp Source Current

–15

µA

Error Amp Sink Current

225

µA

RUN/SS Threshold

l

0.4

1

1.4

V

RUN/SS Input Current – Shutdown

0.02

1

µA

RUN/SS Input Current – Active

0.28

1

µA

PWM Threshold

Measured at PWM Pin; Voltage at which Burst Mode Operation is

Disabled (PWMing Enabled)

0.4

1

1.4

V

PWM Input Current

1.25

2.5

µA

Note 3: This IC includes overtemperature protection that is intended

to protect the device during momentary overload conditions. Junction

temperature will exceed 125°C when overtemperature protection is active.

Continuous operation above the specified maximum operating junction

temperature may result in device degradation or failure.

Note 4: The IC is tested in a feedback loop to make this measurement.

Note 5: Current Measurements are performed when the outputs are not

switching.