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AN4230 Datasheet(PDF) 6 Page - STMicroelectronics

Part # AN4230
Description  Many standards have created requirements and references for the construction
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4230 Datasheet(HTML) 6 Page - STMicroelectronics

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NIST SP800-22b test suite
AN4230
6/24
DocIDID024118 Rev 1
2
NIST SP800-22b test suite
2.1
Introduction
The NIST SP800-22b statistical test suite has been carried out using a statistical test suite
(sts) developed by the National institute of standards and technology (NIST) to probe the
quality of random generators for cryptographic applications. A comprehensive description of
the suite was presented in the paper entitled: “A Statistical Test Suite for the Validation of
Random Number Generators and Pseudo Random Number Generators for Cryptographic
Applications”.
2.2
NIST SP800-22b test suite description
The NIST SP800-22b statistical test suite “sts-2.1.1” is a software package which was
developed by the National Institute of Standards and Technology; it can be downloaded
from the NIST web site at the following address:
http://csrc.nist.gov/groups/ST/toolkit/rng/documentation_software.html
The source code has been written in ANSI C. The NIST statistical test suite consists of 15
tests that were developed to test the randomness of a binary sequence. These tests focus
on a variety of types of non-randomness that could exist in a sequence. From this point of
view, the test suite can be classified as follows:
Frequency tests
• Frequency (Monobit) test:
To measure the distribution of 0’s and 1’s in a sequence and to check if the result is similar
to the one expected for a truly random sequence.
• Frequency test within a block:
To check whether the frequency of 1’s in an M-bit block is approximately M/2, as would
be expected from the theory of randomness.
• Run tests:
To assess if the expected total number of runs of 1’s and 0’s of various lengths is as
expected for a random sequence.
• Test of the longest run of 1’s in a block:
To examine the long runs of 1’s in a sequence.
Test of linearity
• Binary matrix rank test:
To assess the distribution of the rank for 32x32 binary matrices.
• Linear complexity test:
To determine the linear complexity of a finite sequence.
Test of correlation (by means of Fourier transform)
• Discrete Fourier transform (spectral) test:
To assess the spectral frequency of a bit string via the spectral test based on the discrete
Fourier transform. It is sensitive to the periodicity in the sequence.


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