4

Specifications ispLSI 2064VE

Switching Test Conditions

+ 3.3V

R1

R2

Device

Output

Test

Point

0213A/2064V

Figure 2. Test Load

DC Electrical Characteristics

Over Recommended Operating Conditions

SYMBOL

1. One output at a time for a maximum duration of one second. V

= 0.5V was selected to avoid test

problems by tester ground degradation. Characterized but not 100% tested.

2. Measured using four 16-bit counters.

3. Typical values are at V = 3.3V and T = 25

°C.

4. Maximum I

varies widely with specific device configuration and operating frequency. Refer to the Power Consumption

section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to

estimate maximum I

.

Table 2-0007/2064VE

1

PARAMETER

2, 4

Output Low Voltage

Output High Voltage

Input or I/O High Leakage Current

Input or I/O Low Leakage Current

BSCAN Input Low Leakage Current

I/O Active Pull-Up Current

Output Short Circuit Current

Operating Power Supply Current

I = 8 mA

I

= -4 mA

0V

≤ V ≤ V (Max.)

0V

≤ V ≤ V

0V

≤ V ≤ V

V = 3.3V, V

= 0.5V

V = 0.0V, V = 3.0V

f

= 1 MHz

OL

OH

IN

IL

IN

IL

IN

IL

CC

OUT

CLOCK

IL

IH

CONDITION

MIN.

TYP.

MAX.

UNITS

3

–

2.4

–

–

–

–

–

–

–

–

90

–

–

–

–

–

–

–

0.4

–

10

10

-10

-150

-150

-100

–

V

V

µA

µA

µA

µA

µA

mA

mA

CC

A

OUT

CC

CC

(V

– 0.2)V

≤ V ≤ V

V

≤ V ≤ 5.25V

IN

CC

CC

IN

CC

Input Pulse Levels

Table 2-0003/2064VE

Input Rise and Fall Time

Input Timing Reference Levels

Output Timing Reference Levels

Output Load

GND to 3.0V

1.5V

1.5V

See Figure 2

3-state levels are measured 0.5V from

steady-state active level.

≤ 1.5 ns 10% to 90%

TEST CONDITION

R1

R2

CL

A

316

Ω

348

Ω

35pF

B

∞

348

Ω

35pF

316

Ω

348

Ω

35pF

Active High

Active Low

C

316

Ω

348

Ω

5pF

∞

348

Ω

5pF

Active Low to Z

at V +0.5V

OL

Active High to Z

at V

-0.5V

OH

Table 2-0004/2064V

Output Load Conditions (see Figure 2)