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GAL20V8ZD-12QJ Datasheet(PDF) 10 Page - Lattice Semiconductor |
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GAL20V8ZD-12QJ Datasheet(HTML) 10 Page - Lattice Semiconductor |
10 / 19 page Specifications GAL20V8Z GAL20V8ZD 10 SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS C I Input Capacitance 10 pF V CC = 5.0V, VI = 2.0V C I/O I/O Capacitance 10 pF V CC = 5.0V, VI/O = 2.0V *Characterized but not 100% tested Recommended Operating Conditions Commercial Devices: Ambient Temperature (T A) ............................... 0 to 75°C Supply voltage (V CC) with Respect to Ground ..................... +4.75 to +5.25V DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER CONDITION MIN. TYP.2 MAX. UNITS VIL Input Low Voltage Vss – 0.5 — 0.8 V VIH Input High Voltage 2.0 — Vcc+1 V IIL Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (MAX.) — — –10 µA IIH Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC —— 10 µA VOL Output Low Voltage IOL = MAX. Vin = VIL or VIH — — 0.5 V VOH Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 — — V IOH = -100 µA Vin = VIL or VIH Vcc-1 — — V IOL Low Level Output Current — — 16 mA IOH High Level Output Current — — –3.2 mA IOS1 Output Short Circuit Current VCC = 5V VOUT = 0.5V TA = 25 °C –30 — –150 mA COMMERCIAL ISB Stand-by Power VIL = GND VIH = Vcc Outputs Open Z-12/-15 — 50 100 µA Supply Current ZD-12/-15 ICC Operating Power VIL = 0.5V VIH = 3.0V Z-12/-15 — — 55 mA Supply Current ftoggle = 15 MHz Outputs Open ZD-12/-15 1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground degradation. Characterized but not 100% tested. 2) Typical values are at Vcc = 5V and TA = 25 °C Absolute Maximum Ratings(1) Supply voltage V CC ........................................ –.5 to +7V Input voltage applied .......................... –2.5 to V CC +1.0V Off-state output voltage applied ......... –2.5 to V CC +1.0V Storage Temperature ................................ –65 to 150 °C Ambient Temperature with Power Applied ........................................... –55 to 125 °C 1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). Capacitance (TA = 25 °C, f = 1.0 MHz) |
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