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3

Pre-Irradiation

IRHG597110

International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.

The hardness assurance program at International Rectifier is comprised of two radiation environments.

Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both

pre- and post-irradiation performance are tested and specified using the same drive circuitry and test

conditions in order to provide a direct comparison.

International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for

Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.

Parameter

Test Conditions

Min

Max

Min

Max

Drain-to-Source Breakdown Voltage

-100

—

-100

—

V

Gate Threshold Voltage

- 2.0

-4.0

- 2.0

-4.0

Gate-to-Source Leakage Forward

—

-100

—

-100

nA

Gate-to-Source Leakage Reverse

—

100

—

100

Zero Gate Voltage Drain Current

—

-10

—

-10

µA

Static Drain-to-Source

„

—

0.916

—

0.936

Ω

On-State Resistance (TO-39)

Static Drain-to-Source

„

—

0.96

—

0.98

Ω

On-State Resistance (MO-036AB)

1. Part number IRHG597110

2. Part number IRHG593110

Diode Forward Voltage

„

—

-3.5

—

-3.5

V

Fig a. Typical Single Event Effect, Safe Operating Area

For footnotes refer to the last page

LET

Energy

Range

VDS (V)

(MeV)

(µm)

@VGS =

@VGS =

@VGS =

@VGS =

@VGS =

0V

5V

10V

15V

20V

38 ± 5%

270 ± 7.5%

35 ± 7.5%

-100

-100

-100

-100

-100

61 ± 5%

330 ± 7.5%

30 ± 7.5%

-100

-100

-100

-100

-25

84 ± 5%

350 ± 7.5%

28 ± 7.5%

-100

-100

-100

-30

-

-120

-100

-80

-60

-40

-20

0

0

5

10

15

20

Bias VGS (V)

LET=38 ± 5%

LET=61 ± 5%

LET=84 ± 5%

Table 2. Typical Single Event Effect Safe Operating Area (Per Die)