NCX8200

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© NXP Semiconductors N.V. 2015. All rights reserved.

Product data sheet

Rev. 1 — 15 May 2015

8 of 14

NXP Semiconductors

NCX8200

Audio jack configuration switch matrix

13.1 Test circuit and graphs

Fig 5.

Test circuit for measuring ON resistance

Fig 6.

Test circuit for measuring leakage current

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VDD

CONX

GND

VSW

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VDD

CONX

MIC

MIB

CONX

GND

V

(1) SNS RON

(2) GRD RON

MIB RON

Fig 7.

GRD and SNS channel ON resistance

Fig 8.

MIB channel ON resistance