NXP Semiconductors

PESD5V0X2UM

Ultra low capacitance unidirectional double ESD protection diode

PESD5V0X2UM

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Product data sheet

3 February 2014

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10. Test information

10.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

11. Application information

The device is designed for the protection of up to two unidirectional data lines from surge

pulses and ESD damage.

006aab252

bidirectional protection

of one line

DUT

line 1 to be protected

GND

DUT

line 1 to be protected

unidirectional protection

of two lines

line 2 to be protected

GND

Fig. 7. Application diagram

Circuit board layout and protection device placement

Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT)

and surge transients. The following guidelines are recommended:

1. Place the device as close to the input terminal or connector as possible.

2. Minimize the path length between the device and the protected line.

3. Keep parallel signal paths to a minimum.

4. Avoid running protected conductors in parallel with unprotected conductors.

5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and

ground loops.

6. Minimize the length of the transient return path to ground.

7. Avoid using shared transient return paths to a common ground point.

8. Use ground planes whenever possible. For multilayer PCBs, use ground vias.