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MIC384 Datasheet(PDF) 4 Page - Micrel Semiconductor |
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MIC384 Datasheet(HTML) 4 Page - Micrel Semiconductor |
4 / 21 page MIC384 Micrel MIC384 4 September 2000 Symbol Parameter Condition Min Typ Max Units Serial Data I/O Pin (DATA) V OL Low Output Voltage I OL = 3mA 0.4 V Note 6 I OL = 6mA 0.8 V V IL Low Input Voltage 2.7V ≤ V DD ≤ 5.5V 0.3V DD V V IH High Input Voltage 2.7V ≤ V DD ≤ 5.5V 0.7V DD V C IN Input Capacitance 10 pF I LEAK Input current ±0.01 ±1 µA Serial Clock Input (CLK) V IL Low Input Voltage 2.7V ≤ V DD ≤ 5.5V 0.3V DD V V IH High Input Voltage 2.7V ≤ V DD ≤ 5.5V 0.7V DD V C IN Input Capacitance 10 pF I LEAK Input current ±0.01 ±1 µA Status Output (/INT) V OL Low Output Voltage, I OL = 3mA 0.4 V Note 6 I OL = 6mA 0.8 V t INT Interrupt Propagation Delay, from TEMPx > T_SETx or TEMPx < T_HYSTx t CONV+1 µs Note 7, 8 to /INT < V OL, FQ = 00, RPULLUP = 10kΩ t nINT Interrupt Reset Propagation Delay, from any register read to /INT > V OH, 1 µs Note 7 R PULLUP = 10kΩ T_SET0 Default T_SET0 Value t POR after VDD > VPOR 81 81 81 °C T_HYST0 Default T_HYST0 Value t POR after VDD > VPOR 76 76 76 °C T_SET1 Default T_SET1 Value t POR after VDD > VPOR 97 97 97 °C T_HYST1 Default T_HYST1 Value t POR after VDD > VPOR 92 92 92 °C T_SET2 Default T_SET2 Value t POR after VDD > VPOR 97 97 97 °C T_HYST2 Default T_HYST2 Value t POR after VDD > VPOR 92 92 92 °C Serial Interface Timing (Note 7) t 1 CLK (Clock) Period 2.5 µs t 2 Data In Setup Time to CLK High 100 ns t 3 Data Out Stable After CLK Low 0 ns t 4 DATA Low Setup Time to CLK Low start condition 100 ns t 5 DATA High Hold Time stop condition 100 ns After CLK High Note 1. Exceeding the absolute maximum rating may damage the device. Note 2. The device is not guaranteed to function outside its operating rating. Note 3. Devices are ESD sensitive. Handling precautions recommended. Human body model: 1.5k in series with 100pF. Machine model: 200pF, no series resistance. Note 4. Final test on outgoing product is performed at T A = TBD°C. Note 5. T D is the temperature of the remote diode junction. Testing is performed using a single unit of one of the transistors listed in Table 6. Note 6. Current into this pin will result in self-heating of the MIC384. Sink current should be minimized for best accuracy. Note 7. Guaranteed by design over the operating temperature range. Not 100% production tested. Note 8. t CONV = tCONV0 +(2 X tCONV1). tCONV0 is the conversion time for the local zone; tCONV1 is the conversion time for the remote zones.` |
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