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ICL7126CPLZ Datasheet(PDF) 8 Page - Intersil Corporation |
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ICL7126CPLZ Datasheet(HTML) 8 Page - Intersil Corporation |
8 / 15 page 8 FN3084.5 TEST The TEST pin serves two functions. It is coupled to the internally generated digital supply through a 500 Ω resistor. Thus it can be used as the negative supply for externally generated segment drivers such as decimal points or any other presentation the user may want to include on the LCD display. Figures 6 and 7 show such an application. No more than a 1mA load should be applied. The second function is a “lamp test”. When TEST is pulled high (to V+) all segments will be turned on and the display should read “-1888”. The TEST pin will sink about 10mA under these conditions. CAUTION: In the lamp test mode, the segments have a constant DC volt- age (no square-wave) and may burn the LCD display if left in this mode for several minutes. Digital Section Figure 8 shows the digital section for the ICL7126. An internal digital ground is generated from a 6V Zener diode and a large P-Channel source follower. This supply is made stiff to absorb the relative large capacitive currents when the back plane (BP) voltage is switched. The BP frequency is the clock frequency divided by 800. For three readings/second this is a 60Hz square wave with a nominal amplitude of 5V. The segments are driven at the same frequency and amplitude and are in phase with BP when OFF, but out of phase when ON. In all cases negligible DC voltage exists across the segments. The polarity indication is “ON” for negative analog inputs. If IN LO and IN HI are reversed, this indication can be reversed also, if desired. System Timing Figure 9 shows the clocking arrangement used in the ICL7126. Two basic clocking arrangements can be used: Figure 9A, an external oscillator connected to pin 40. Figure 9B, an R-C oscillator using all three pins. The oscillator frequency is divided by four before it clocks the decade counters. It is then further divided to form the three convert-cycle phases. These are signal integrate (1000 counts), reference de-integrate (0 to 2000 counts) and auto-zero (1000 to 3000 counts). For signals less than full-scale, auto-zero gets the unused portion of reference de-integrate. This makes a complete measure cycle of 4,000 counts (16,000 clock pulses) independent of input voltage. For three readings/second, an oscillator frequency of 48kHz would be used. To achieve maximum rejection of 60Hz pickup, the signal integrate cycle should be a multiple of 60Hz. Oscillator frequencies of 60kHz, 48kHz, 40kHz, 331/3kHz, etc. should be selected. For 50Hz rejection, oscillator frequencies of 662/3kHz, 50kHz, 40kHz, etc. would be suitable. Note that 40kHz (2.5 readings/sec.) will reject both 50Hz and 60Hz (also 400Hz and 440Hz). ICL7126 V+ BP TEST 21 37 TO LCD BACKPLANE TO LCD DECIMAL POINT 1M Ω ICL7126 V+ BP TEST DECIMAL POINT SELECT CD4030 GND V+ TO LCD DECIMAL POINTS V+ = DP ON GND = DP OFF FIGURE 7. EXCLUSIVE ‘OR’ GATE FOR DECIMAL POINT DRIVE ICL7126 FIGURE 6. SIMPLE INVERTER FOR FIXED DECIMAL POINT |
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