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G9201 Datasheet(PDF) 1 Page - Hamamatsu Corporation |
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G9201 Datasheet(HTML) 1 Page - Hamamatsu Corporation |
1 / 9 page Image sensor for DWDM wavelength monitor G9201 to G9204 series InGaAs linear image sensors www.hamamatsu.com 1 The G9201 to G9204 series are InGaAs linear image sensors designed for WDM monitor detectors in optical communications. These linear image sensors contain a CMOS charge amplifier array, a CDS circuit, an offset compensation circuit, a shift register and a timing generator, along with an InGaAs photodiode array, and deliver high sensitivity and stable operation in the near in- frared range. The package is hermetically sealed for high reliability and the light input window has an anti-reflective coating to improve the light detection efficiency. The signal processing circuit on the CMOS chip allows selecting two conversion efficiencies (CE) by external voltage. A wide dy- namic range can be obtained when the image sensor is operated at CE=16 nV/e-, while a high gain can be obtained at CE=320 nV/e-. Applications Options DWDM wavelength monitor InGaAs multichannel detector head C8061-01*3 Optical spectrum analyzer Multichannel detector head controller C7557-01*3 Features Wide dynamic range CDS circuit*1 Low noise and low dark current Offset compensation circuit Two selectable conversion efficiencies Simple operation (by built-in timing generator *2) Anti-saturation circuit High resolution: 25 μm pitch (512 ch) Low crosstalk 256 ch: 1 video line 512 ch: 2 video lines Selection guide Type no. Cooling Image size Number of total pixels Number of effective pixels Spectral response range Defective pixels Appilcable multichannel detector head (mm) (μm) G9201-256S One-stage TE-cooled 12.8 × 0.25 256 256 0.9 to 1.67 (-10 °C) 0 C8061-01 G9202-512S One-stage TE-cooled 512 512 0.9 to 1.67 (-10 °C) C8061-01 G9203-256D*4 Non-cooled 12.8 × 0.50 256 256 0.9 to 1.7 (25 °C) - G9203-256S One-stage TE-cooled 256 256 0.9 to 1.67 (-10 °C) C8061-01 G9204-512D*4 Non-cooled 512 512 0.9 to 1.7 (25 °C) - G9204-512S One-stage TE-cooled 512 512 0.9 to 1.67 (-10 °C) C8061-01 *1: A major source of noise in charge amplifiers is the reset noise generated when the integration capacitance is reset. A CDS circuit greatly reduces this reset noise by holding the signal immediately after reset to find the noise differential. *2: In conventional image sensor operation, external PLD (programmable logic device), etc. is used to input the required timing signals. However, the G9201 to G9204 series image sensors internally generate all timing signals on the CMOS chip just by supplying CLK and RESET pulses. This makes it simple to set the timings. *3: The G9203-256D and G9204-512D are not available for the C7557-01. |
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