NCP51400, NCV51400

www.onsemi.com

2

PIN FUNCTION DESCRIPTION

Pin Number

Pin Name

Pin Function

1

2

Power input. Internally connected to the output source MOSFET.

3

Power Output of the Linear Regulator.

4

Power Ground. Internally connected to the output sink MOSFET.

5

remote DDR termination bypass capacitors.

6

0.1

mF ceramic capacitor.

7

EN

Shutdown Control Input. CMOS compatible input. Logic high = enable, logic low = shutdown. Connect

8

GND

Common Ground.

9

Power Good (Open Drain output).

10

Analog power supply input. Connect to GND thru a 1 − 4.7

mF ceramic capacitor.

THERMAL

PAD

Pad for thermal connection. The exposed pad must be connected to the ground plane using multiple

vias for maximum power dissipation performance.

ABSOLUTE MAXIMUM RATINGS

Rating

Symbol

Value

Unit

−0.3 to 6.0

V

−0.3 to 6.0

V

−0.3 to +0.3

V

Storage Temperature

−55 to 150

°C

Operating Junction Temperature Range

150

°C

ESD Capability, Human Body Model (Note 2)

2000

V

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality

should not be assumed, damage may occur and reliability may be affected.

1. Refer to ELECTRICAL CHARACTERISTICS and APPLICATION INFORMATION for Safe Operating Area.

2. This device series incorporates ESD protection and is tested by the following method:

ESD Human Body Model tested per AEC−Q100−002 (EIA/JESD22−A114)

ESD Machine Model tested per AEC−Q100−003 (EIA/JESD22−A115)

Latchup Current Maximum Rating tested per JEDEC standard: JESD78.

DISSIPATION RATINGS

Package

Derating Factor above

10−Pin DFN

1.92 W

19 mW/

°C

0.79 W

RECOMMENED OPERATING CONDITIONS

Rating

Symbol

Value

Unit

Supply Voltage

2.375 to 5.5

V

Voltage Range

−0.1 to 1.8

V

0.5 to 1.8

−0.1 to 3.5

−0.1 to +0.1

Operating Free−Air Temperature

−40 to +125

°C

Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond

the Recommended Operating Ranges limits may affect device reliability.