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1N4148-1 Datasheet(PDF) 10 Page - Microsemi Corporation |
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1N4148-1 Datasheet(HTML) 10 Page - Microsemi Corporation |
10 / 19 page MIL-PRF-19500/116L 10 4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified herein. 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I herein. Electrical measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein. 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table VIb (JANTX and JANTXV) of MIL-PRF-19500 and as specified herein. Electrical measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein except for the thermal impedance test. 4.4.2.1 Group B inspection, table VIb (JANTX, JANTXV) of MIL-PRF-19500. Subgroup Method Conditions B2 2005 I F = 100 mA, axial tensile stress = 8 lbs, TA = +150GC; (not applicable to UR or UB package). (This test shall be performed as the first test of subgroup 2). B3 1027 T A = +30GC H5GC, VRWM = 75 V(pk), f = 50-60 Hz (see 4.5.1); 1N914: IO = 5 mA, 1N4531: I O = 125 mA, 1N4148-1: IO = 200 mA. B4 2075 See 4.5.4 herein. B5 3101 R6JL = 250GC/W, .375 inch (9.52 mm) lead length (non-surface mount). or 4081 R6JL 100GC/W (UR), R6JC = 150GC/W (UB). 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein except for the thermal impedance test. Subgroup Method Conditions C2 1056 100 cycles. C2 2036 Tension: Test condition A, t = 15 seconds, weight = 10 pounds. Lead fatigue: Test condition E. Terminal strength and lead fatigue not applicable to UB or UR devices. C6 1026 T A = +30GC H5GC, VRWM = 75 V(pk), f = 50-60 Hz (see 4.5.1), for: 1N914 I O = 75 mA. 1N4531 I O = 125 mA. 1N4148-1 I O = 200 mA. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows. 4.5.1 Pulse measurements. Conditions for pulse measurements shall be specified in section 4 of MIL-STD-750. 4.5.2 Life tests. AC tests shall be conducted with a half-sine wave of the peak voltage specified herein impressed across the diode in the reverse direction, followed by a half-sine waveform of the average rectified current specified herein. The forward conduction angle of the rectified current shall be not greater than 180 degree nor less than 150 degree. |
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