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LV47011P Datasheet(PDF) 2 Page - ON Semiconductor |
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LV47011P Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 10 page LV47011P No.A1838-2/10 Specifications Maximum Ratings at Ta = 25 C Parameter Symbol Conditions Ratings Unit Maximum supply voltage VCC max1 No signal, t = 1 minute 26 V VCC max2 During operations 18 V Maximum output current IO peak Per channel 4.5/ch A Allowable power dissipation Pd max With an infinity heat sink 50 W Operating temperature Topr -40 to +85 C Storage temperature Tstg -40 to +150 C Thermal resistance between the junction and case j-c 1 C/W Recommended Operating Ranges at Ta = 25 C Parameter Symbol Conditions Ratings Unit Recommended supply voltage VCC 14.4 V Recommended load resistance RL op 4 Operating supply voltage range VCC op A range not exceeding Pdmax 8 to 16 V Electrical Characteristics at Ta = 25°C, VCC = 14.4V, RL = 4, f = 1kHz, Rg = 600 Parameter Symbol Conditions Ratings Unit min typ max Quiescent current ICCO RL = , Rg = 0 200 400 mA Standby current Ist Vst = 0V 3 A Voltage gain VG VO = 0dBm 25 26 27 dB Voltage gain difference VG -1 +1 dB Output power PO THD = 10% 24 29 W PO max1 Max Power 45 W PO max2 VCC = 15.2, Max Power 50 W Output offset voltage Vn offset Rg = 0 -100 +100 mV Total harmonic distortion THD PO = 4W 0.03 0.12 % Channel separation CHsep VO = 0dBm, Rg = 10k 55 65 dB Ripple rejection ratio SVRR Rg = 0 , fr = 100Hz, VCCR = 0dBm 50 65 dB Output noise voltage VNO Rg = 0 , B.P.F. = 20Hz to 20kHz 80 150 Vrms Input resistance Ri 40 50 65 k Mute attenuation Matt VO = 20dBm, mute : on 75 90 dB Standby pin control voltage Vstby H Amp : on 2.5 VCC V Vstby L Amp : off 0.0 0.5 V Mute pin control voltage Vmute H Mute : off Open - Vmute L Mute : on 0.0 1.0 V Output offset detection Detection threshold voltage Vosdet 1.2 1.8 2.4 V * 0dBm = 0.775Vrms Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
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