BUCK1

BUCK2

BUCK3

CLOCK

ROSC

12V

for sequenced

start-up

External enable

External enable

External enable

for sequenced

start-up

for sequenced

start-up

+

Low Power mode

Low Power mode

Low Power mode

Biasing

0.8V

0.8V

0.8V

1µA

1µA

1µA

PG&RST

generator

PGOOD

High for forced PWM

Low por autoamtic PFM/PWM mode

F_PWM

TPS652510

www.ti.com

SLVSB30B – SEPTEMBER 2011 – REVISED AUGUST 2013

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM

Copyright © 2011–2013, Texas Instruments Incorporated

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