KAI−0330

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11

DEFECT DEFINITIONS

Table 10. OPERATIONAL CONDITIONS

Description

Symbol

Condition

Junction Temperature

40

°C

Integration Time

40 ms

Readout Rate

40 ms

Table 11. SPECIFICATIONS

Point Defects (Major)

Point Defects (Minor)

Cluster Defects

Column Defects

≤ 2

≤ 15

0

0

Table 12. DEFECT DEFINITIONS

Defect Type

Defect Definition

Major Defective Pixel

A pixel whose signal deviates by more than 25 mV from the mean value of all active pixels under

dark field condition or by more than 15% from the mean value of all active pixels under uniform

illumination at 80% of saturation.

Minor Defective Pixel

A pixel whose signal deviates by more than 6 mV from the mean value of all active pixels under dark

field condition.

Point Defect

An isolated defective pixel.

Cluster Defect

A group of 2 to 4 contiguous major defective pixels.

Column Defect

A group of more than 4 contiguous major defective pixels along a single column or row.

NOTE:

No row defect are allowed.