NB3N106K

http://onsemi.com

3

Table 2. ATTRIBUTES

Characteristic

Value

ESD Protection

Human Body Model

Machine Model

>2 kV

200 V

Moisture Sensitivity (Note 2)

QFN−24

Level 1

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

Transistor Count

286

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

2. For additional information, see Application Note AND8003/D.

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

Positive Power Supply

GND = 0 V

4.6

V

Positive Input

GND = 0 V

V

Output Current

Continuous

Surge

50

100

mA

mA

Operating Temperature Range

QFN−24

−40 to +85

°C

Storage Temperature Range

−65 to +150

°C

Thermal Resistance (Junction−to−Ambient) (Note 3)

0 lfpm

500 lfpm

QFN−24

QFN−24

37

32

°C/W

°C/W

Thermal Resistance (Junction−to−Case)

2S2P (Note 3)

QFN−24

11

°C/W

Wave Solder

Pb−Free

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

3. JEDEC standard 51−6, multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad..