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NCP6133MNTWG Datasheet(PDF) 6 Page - ON Semiconductor |
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NCP6133MNTWG Datasheet(HTML) 6 Page - ON Semiconductor |
6 / 29 page NCP6133 http://onsemi.com 6 ABSOLUTE MAXIMUM RATINGS ELECTRICAL INFORMATION Pin Symbol VMAX VMIN COMP, COMPA VCC + 0.3 V −0.3 V CSCOMP, CSCOMPA VCC + 0.3 V −0.3 V VSN GND + 300 mV GND – 300 mV DIFFOUT, DIFFOUTA VCC + 0.3 V −0.3 V VR_RDY, VR_RDYA VCC + 0.3 V −0.3 V VCC 6.5 V −0.3 V ROSC VCC + 0.3 V −0.3 V IOUT, IOUTA Output 2.0 V −0.3 V VRMP +25 V −0.3 V All Other Pins VCC + 0.3 V −0.3 V *All signals referenced to GND unless noted otherwise. THERMAL INFORMATION Description Symbol Typ Unit Thermal Characteristic − QFN Package, (Note 1) RqJA 68 °C/W Operating Junction Temperature Range, (Note 2) TJ −10 to 125 °C Operating Ambient Temperature Range −10 to 100 °C Maximum Storage Temperature Range TSTG −40 to +150 °C Moisture Sensitivity Level − QFN Package MSL 1 Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. *The maximum package power dissipation must be observed. 1. JESD 51−5 (1S2P Direct−Attach Method) with 0 LFM 2. JESD 51−7 (1S2P Direct−Attach Method) with 0 LFM NCP6133 ELECTRICAL CHARACTERISTICS Unless otherwise stated: −10°C < TA < 100°C; VCC = 5 V; CVCC = 0.1 mF Parameter Test Conditions Min Typ Max Unit ERROR AMPLIFIER Input Bias Current @ 1.3 V −400 400 nA Open Loop DC Gain CL = 20 pF to GND, RL = 10 kW to GND 80 dB Open Loop Unity Gain Bandwidth CL = 20 pF to GND, RL = 10 kW to GND 50 MHz Slew Rate DVin = 100 mV, G = 10 V/V, DVout = 1.5 V – 2.5 V, CL = 20 pF to GND, DC Load = 10 k to GND 20 V/ms Maximum Output Voltage ISOURCE = 2.0 mA 3.5 − − V Minimum Output Voltage ISINK = 2.0 mA − − 1 V DIFFERENTIAL SUMMING AMPLIFIER Input Bias Current VSP, VSPA ,VSN, VSNA = 1.3 V −400 − 400 nA VSP Input Voltage Range −0.3 − 3.0 V VSN Input Voltage Range −0.3 − 0.3 V 3. Guaranteed by design or characterization data, not in production test. |
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