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NOIH2SM1000A Datasheet(PDF) 8 Page - ON Semiconductor |
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NOIH2SM1000A Datasheet(HTML) 8 Page - ON Semiconductor |
8 / 66 page NOIH2SM1000A www.onsemi.com 8 Table 9. SCREENING No. Test Condition Number of Devices Test Method Test 8 Temperature cycling MIL-STD-883 method 1010 All B - 10 cycles –55°C +125°C 9 Biased Burn-in MIL-STD-883 method 1015 All 240 h at +125°C 10 Mobile Particle Detection MIL-STD-883 method 2020 All A 11 Fine leak test MIL-STD-883 method 1014 All A 12 Gross leak test MIL-STD-883 method 1014 All C 13 HCRT Electrical measurements 12MBE83443F All HT +85°C LT –40°C RT +22°C 14 Final Visual Inspection 12MON56972E All Figure 2. HAS2 Assembly LAT Flow |
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