NOIH2SM1000S-HWC datasheet(8/66 Pages) ONSEMI

Part #	NOIH2SM1000S-HWC

Description	HAS2 Image Sensor

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NOIH2SM1000A

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Table 9. SCREENING

No.

Test Condition

Number of Devices

Test Method

Test

8

Temperature cycling

MIL-STD-883 method 1010

All

B - 10 cycles

–55°C +125°C

9

Biased Burn-in

MIL-STD-883 method 1015

All

240 h at +125°C

10

Mobile Particle Detection

MIL-STD-883 method 2020

All

A

11

Fine leak test

MIL-STD-883 method 1014

All

A

12

Gross leak test

MIL-STD-883 method 1014

All

C

13

HCRT Electrical measurements

12MBE83443F

All

HT +85°C

LT –40°C

RT +22°C

14

Final Visual Inspection

12MON56972E

All

Figure 2. HAS2 Assembly LAT Flow

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NOIH2SM1000S-HWC Datasheet(PDF) 8 Page - ON Semiconductor

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