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NLAS54405 Datasheet(PDF) 7 Page - ON Semiconductor |
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NLAS54405 Datasheet(HTML) 7 Page - ON Semiconductor |
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7 / 18 page  NLAS54405 www.onsemi.com 7 DC ELECTRICAL CHARACTERISTICS (Voltages referenced to GND) 3.3 V Supply: VDD = +3.0 V to +3.6 V, GND = 0 V, VDIR_SEL = VAC/DC = GND, V5V_SUPPLY = Float, VSIGNAL = 2 VRMS, RLOAD = 20 kW, f = 1 kHz, VSELH = VMUTEH = 1.4 V, VSELL = VMUTEL = 0.5 V, CAP_SS = 0.1 mF, (Note 2), Unless otherwise specified. Parameter Units Max (Notes 3, 4) Typ Min (Notes 3, 4) Temp ( 5C) Supply (V) Test Conditions DIGITAL INPUT CHARACTERISTICS Input Voltage Low, VSELL, VMUTEL 3.3, 5 Full − − 0.5 V Input Voltage High, VSELH, VMUTEH 3.3, 5 Full 1.4 − − V Input Current, ISELH, ISELL VDD = 3.6 V, VMUTE = 0 V, VSEL = 0 V or VDD 3.6 Full −0.5 0.01 0.5 mA Input Current, IAC/DCL, IDIR_SELL VDD = 3.6 V, VAC/DC, VDIR_SEL = 0 V, VMUTE = Float, VSEL = VDD 3.6 Full −1.3 −0.7 0.3 mA Input Current, IAC/DCH, IDIR_SELH VDD = 3.6 V, VAC/DC, VDIR_SEL = VDD, VMUTE = 0 V, VSEL = 0 V 3.6 Full −0.5 0.01 0.5 mA Input Current, IMUTEL VDD = 3.6 V, VSEL = VDD, VMUTE = 0 V 3.6 Full −1.3 −0.7 0.3 mA Input Current, IMUTEH VDD = 3.6 V, VSEL = 0 V, VMUTE = VDD 3.6 Full −0.5 0.01 0.5 mA 2. VIN = input voltage to perform proper function. 3. The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet. 4. Parameters with MIN and/or MAX limits are 100% tested at +25 °C, unless otherwise specified. Temperature limits established by charac- terization and are not production tested. 5. Flatness is defined as the difference between maximum and minimum value of ON−resistance at the specified analog signal voltage points. 6. Limits established by characterization and are not production tested. 7. rON matching between channels is calculated by subtracting the channel with the highest max rON value from the channel with lowest max rON value. 8. Crosstalk is inversely proportional to source impedance. Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. TEST CIRCUITS AND WAVEFORMS Figure 3. Switching Times TEST CIRCUIT MEASUREMENT POINTS |
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