LM60, LM60-Q1

SNIS119E – MAY 2004 – REVISED SEPTEMBER 2015

www.ti.com

Electrical Characteristics (continued)

otherwise noted.

PARAMETER

TEST CONDITIONS

UNIT

82

110

μA

Quiescent Current

2.7 V

125

μA

Change of Quiescent Current

2.7 V

±5

μA

Temperature Coefficient of

0.2

μA/°C

Quiescent Current

±0.2

°C

for 1000 hours

(6)

For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, temperature cycled for at

least 46 hours before long-term life test begins for both temperatures. This is especially true when a small (surface-mount) part is wave-

soldered; allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures.

The drift after 1000 hours will not continue at the first 1000 hour rate.

6

Submit Documentation Feedback

Copyright © 2004–2015, Texas Instruments Incorporated

Product Folder Links: LM60 LM60-Q1